Oh, Joo Suk
93  Ergebnisse:
Personensuche X
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List of Contributors:

, In: Bladder Cancer,
Burton, Jeremy P. ; Chanyi, Ryan M. ; Cho, Jeong Y.... - p. xxi-xxiii , 2018
 
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Behaviour of Adjacent Ground and Existing Tunnel According ..:

, In: Proceedings of the 1st International Conference on Numerical Modelling in Engineering; Lecture Notes in Civil Engineering,
Kong, Suk-Min ; Oh, Dong-Wook ; Lee, Yong-Joo - p. 44-53 , 2018
 
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Systematic study on bias temperature instability of various..:

, In: 2009 IEEE International Reliability Physics Symposium,
 
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A 16Gb 27Gb/s/pin T-coil based GDDR6 DRAM with Merged-MUX T..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Lee, Daewoong ; Kwon, Hye-Jung ; Kwon, Daehyun... - p. 446-448 , 2022
 
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The Effects of Product's Visual Preview and Customer Review..:

, In: Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing; Studies in Computational Intelligence,
Im, Eun Tack ; Phuong, Huy Tung ; Oh, Myung Suk.. - p. 209-228 , 2021
 
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Effective Substrate Thermal Conductivity Modeling Method Ex..:

, In: 2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm),
Hwang, Seungtae ; Lee, Bang weon ; Kim, Taehwan... - p. 244-248 , 2020
 
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Electrical and Thermal Co-Analysis of Thermally Efficient S..:

, In: 2019 Electrical Design of Advanced Packaging and Systems (EDAPS),
 
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Development of Plasma-Damage Free Neutral Beam Sputtering S..:

, In: 2008 Flexible Electronics and Displays Conference and Exhibition,
 
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13

History of "Making a Thumb":

, In: The Thumb,
Oh, Suk Joon - p. 3-9 , 2019
 
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Statistical Reliability Modeling and Analysis for Repairabl..:

, In: Springer Series in Reliability Engineering; Advances in Reliability and Maintainability Methods and Engineering Applications,
Bae, Suk Joo ; Mun, Byeong Min ; Kvam, Paul H. - p. 155-178 , 2023
 
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Thermal Modeling and Analysis of High Bandwidth Memory in 2..:

, In: 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm),
Kim, Taehwan ; Lee, Jonggyu ; Kim, Jaechoon... - p. 1-5 , 2022
 
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