Oni, Ebenezer T.
20  Ergebnisse:
Personensuche X
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1

The Challenges of Legislative-Executive Frictions over Inst..:

, In: Advances in African Economic, Social and Political Development; Perspectives on the Legislature and the Prospects of Accountability in Nigeria and South Africa,
 
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2

A Cost Effective Groundnut Oil Producing Machine for Rural ..:

, In: 2023 International Conference on Science, Engineering and Business for Sustainable Development Goals (SEB-SDG),
 
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3

Contributors:

, In: Biochemical and Molecular Pharmacology in Drug Discovery,
 
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4

List of contributors:

, In: Applications of Essential Oils in the Food Industry,
 
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5

Physicochemical, Functional and Viscosity Profile of Starch..:

, In: 2023 International Conference on Science, Engineering and Business for Sustainable Development Goals (SEB-SDG),
 
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6

Erratum to: Provider Workload and Multiple Morbidities in t..:

, In: SpringerBriefs in Public Health; Global Health Collaboration,
 
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7

Provider Workload and Multiple Morbidities in the Caribbean..:

, In: SpringerBriefs in Public Health; Global Health Collaboration,
 
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8

DrGaN: an Integrated CMOS Driver-GaN Power Switch Technolog..:

, In: 2023 International Electron Devices Meeting (IEDM),
Then, Han Wui ; Radosavljevic, M. ; Bader, S.... - p. 1-4 , 2023
 
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9

List of contributors:

, In: Engineering Plant-Based Food Systems,
Aldalur, Ane ; Andrei, Mihaela ; Bandara, Nandika... - p. xi-xii , 2023
 
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10

Exploring manufacturability of novel 2D channel materials: ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Dorow, C. J. ; Schram, T. ; Smets, Q.... - p. 1-4 , 2023
 
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11

High Mobility TMD NMOS and PMOS Transistors and GAA Archite..:

, In: 2023 International Electron Devices Meeting (IEDM),
Penumatcha, A. ; O'Brien, K. P. ; Maxey, K.... - p. 1-4 , 2023
 
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12

Demonstration of a Stacked CMOS Inverter at 60nm Gate Pitch..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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13

Scaled Submicron Field-Plated Enhancement Mode High-K Galli..:

, In: 2022 International Electron Devices Meeting (IEDM),
Then, Han Wui ; Radosavljevic, M. ; Koirala, P.... - p. 35.1.1-35.1.4 , 2022
 
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14

Gate length scaling beyond Si: Mono-layer 2D Channel FETs R..:

, In: 2022 International Electron Devices Meeting (IEDM),
Dorow, C. J. ; Penumatcha, A. ; Kitamura, A.... - p. 7.5.1-7.5.4 , 2022
 
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15

300 mm MOCVD 2D CMOS Materials for More (Than) Moore Scalin:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Maxey, K. ; Naylor, C. H. ; O'Brien, K. P.... - p. 419-420 , 2022
 
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