Padovani, Paolo
10  Ergebnisse:
Personensuche X
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1

The Major Effect of Trapped Charge on Dielectric Breakdown ..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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2

Towards a Universal Model of Dielectric Breakdown:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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3

Modeling Degradation and Breakdown in SiO2 and High-k Gate ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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4

Electrically active defects in Al2O3-InGaAs MOS stacks at c..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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5

Active Shock/Vibes Rejection in FM MEMS Accelerometers:

, In: 2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL),
 
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6

Contributors:

, In: Diagnosis and Management in Dementia,
 
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7

Contributors:

, In: Advances in Non-Volatile Memory and Storage Technology,
Ambrogio, Stefano ; Ando, Y. ; Bersuker, G.... - p. xi-xiii , 2019
 
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8

Advanced modeling and characterization techniques for innov..:

, In: Advances in Non-Volatile Memory and Storage Technology,
 
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9

Large Middle Cerebral Artery and Panhemispheric Infarction:

, In: Frontiers of Neurology and Neuroscience; Manifestations of Stroke,
 
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10

Integrating a thermo-mechanical solver into the DJOSER anal..:

, In: 2008 Second International Conference on Thermal Issues in Emerging Technologies,
 
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