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Paek, Sanghyun
5  Ergebnisse:
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1

Automotive Process Reliability Prediction for 5,7nm using M:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Jayaram, Srividya ; Lee, Hyung Joo ; Kim, Dongin... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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2

Reliability Prediction for Automotive 5nm and 7nm Technolog..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Lee, Hyung Joo ; Kim, Dongin ; Choi, Sanghyun... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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3

Hiding cache miss penalty using priority-based execution fo..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Park, Sanghyun ; Shrivastava, Aviral ; Paek, Yunheung - p. 1190-1195 , 2008
Link: https://dl.acm.org/doi/1..
 
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4

SPKM : a novel graph drawing based algorithm for applica..:

, In: Proceedings of the 2008 Asia and South Pacific Design Automation Conference,
Yoon, Jonghee W. ; Shrivastava, Aviral ; Park, Sanghyun... - p. 776-782 , 2008
Link: https://dl.acm.org/doi/1..
 
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5

Bypass aware instruction scheduling for register file power..:

, In: Proceedings of the 2006 ACM SIGPLAN/SIGBED conference on Language, compilers, and tool support for embedded systems,
Park, Sanghyun ; Shrivastava, Aviral ; Dutt, Nikil... - p. 173-181 , 2006
Link: https://dl.acm.org/doi/1..
 
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