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Park, Byung-Eun
213  Ergebnisse:
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1

Nonvolatile Ferroelectric Memory Transistors Using PVDF, P(..:

, In: Topics in Applied Physics; Ferroelectric-Gate Field Effect Transistor Memories,
Han, Dae-Hee ; Park, Byung-Eun - p. 177-194 , 2020
Link: https://doi.org/10.1007/..
 
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2

Non-volatile Organic Ferroelectric Field-Effect Transistors..:

, In: Topics in Applied Physics; Ferroelectric-Gate Field Effect Transistor Memories,
Han, Dae-Hee ; Kim, Min Gee ; Park, Byung-Eun - p. 307-315 , 2020
Link: https://doi.org/10.1007/..
 
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3

Paper Transistors with Organic Ferroelectric P(VDF-TrFE) Th..:

, In: Topics in Applied Physics; Ferroelectric-Gate Field Effect Transistor Memories,
Han, Dae-Hee ; Park, Byung-Eun - p. 291-305 , 2020
Link: https://doi.org/10.1007/..
 
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4

Building ambidextrous capabilities in foreign subsidiaries:..:

, In: Research Handbook on Knowledge Transfer and International Business,
Lee, Jae-Eun ; Il Park, Byung ; Kyu Lew, Yong , 2022
Link: https://doi.org/10.4337/..
 
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5

Highly scalable and reliable 2-bit/cell SONOS memory transi..:

, In: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005.,
Byung Yong Choi ; Dong Won Kim ; Choong-Ho Lee... - p. 118,119 , 2005
Link: https://doi.org/10.1109/..
 
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6

13.2 A 32Gb 8.0Gb/s/pin DDR5 SDRAM with a Symmetric-Mosaic ..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Choi, Ikjoon ; Hong, Seunghwan ; Kim, Kihyun... - p. 234-236 , 2024
Link: https://doi.org/10.1109/..
 
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7

Effects of various environmental conditions on the electric..:

, In: 2014 IEEE 64th Electronic Components and Technology Conference (ECTC),
Bae, Byung-Hyun ; Jeong, Min-Su ; Lee, Byeong Rok... - p. 1735-1739 , 2014
Link: https://doi.org/10.1109/..
 
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8

A simulation model with a low level of detail for container..:

, In: Proceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come,
Ha, Byung-Hyun ; Park, Eun-Jung ; Lee, Chan-Hee - p. 2003-2011 , 2007
Link: https://dl.acm.org/doi/1..
 
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9

TiN/HfSiOx Gate Stack Multi-Channel Field Effect Transistor..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,
Kim, Sung Min ; Yoon, Eun Jung ; Kim, Min Sang... - p. 72-73 , 2006
Link: https://doi.org/10.1109/..
 
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10

Local-damascene-finFET DRAM integration with p/sup +/ doped..:

, In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.,
Kim, Yong-Sung ; Lee, Eun-Cheol ; Song, Bo-Young... - p. 315-318 , 2005
Link: https://doi.org/10.1109/..
 
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11

6.10 A 1/1.56-inch 50Mpixel CMOS Image Sensor with 0.5μm pi..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Kim, DongHyun ; Cho, Kwansik ; Ji, Ho-Chul... - p. 118-120 , 2024
Link: https://doi.org/10.1109/..
 
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12

Write Recovery Time Degradation by Thermal Neutrons in DDR4..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Oh, Hyeongseok ; Chun, Myungsun ; Lee, Jiwon... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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13

Thermal-Aware IC Chip Design by Combining High Thermal Cond..:

, In: 2022 5th International Conference on Circuits, Systems and Simulation (ICCSS),
Song, Young Suh ; Tayal, Shubham ; Rahi, Shiromani Balmukund... - p. 135-140 , 2022
Link: https://doi.org/10.1109/..
 
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14

Measurement Conditions of Conduction Current for Diagnosis ..:

, In: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD),
Lee, Seung-Won ; Kwon, Ik-Su ; Park, Byung-Bae... - p. 368-371 , 2022
Link: https://doi.org/10.23919..
 
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15

Effect of Pre-stressed Thermal Ageing and Electric Field du..:

, In: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD),
Kwon, Ik-Su ; Park, Byung-Bae ; Lee, Seong-Won... - p. 786-789 , 2022
Link: https://doi.org/10.23919..
 
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