Park, Wan Sung
177  Ergebnisse:
Personensuche X
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1

Vision based EBR Metrology for Edge Bead Removal Optimizati..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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2

Nasal Tip Techniques (2): Bulbous Tip Correction:

, In: State of the Art Rhinoplasty Techniques,
Park, Sung Wan - p. 73-115 , 2022
 
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4

8.8 A 97.18% Peak-Efficiency Asymmetrically Implemented Dua..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Park, Hyo-Jin ; Cho, Joo-Mi ; Lee, Chan-Ho... - p. 1-3 , 2024
 
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5

8.7 A 92.7% Peak Efficiency 12V-to-60V Input to 1.2V Output..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Choi, Hyeon-Ji ; Lee, Chan-Ho ; Jeon, Young-Jun... - p. 156-158 , 2024
 
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6

A 1V 20.7μW Four-Stage Amplifier Capable of Driving a 4-to-..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Lee, Chan-Ho ; Park, Hyo-Jin ; Cho, Joo-Mi... - p. 1-2 , 2023
 
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7

A Capacitor-less LDO for Mobile Devices with Fast Transient..:

, In: 2023 20th International SoC Design Conference (ISOCC),
Baik, Esun ; Park, Hyo-Jin ; Hong, Sung-Wan - p. 189-190 , 2023
 
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8

96.48% Peak-Efficiency Continuous-Current Step-Up Battery C..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Park, Hyo-Jin ; Cho, Joo-Mi ; Choi, Hyeon-Ji.. - p. 1-2 , 2023
 
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9

A High Slew-rate Wide-range Capacitive Load Driving Buffer ..:

, In: 2022 19th International SoC Design Conference (ISOCC),
Oh, young-Ju ; Park, Hyo-Jin ; Cho, Joo-Mi... - p. 231-232 , 2022
 
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10

Application of Digital Image Processing to Water Level Meas..:

, In: Proceedings of the 2019 2nd International Conference on Information Hiding and Image Processing,
Kim, Sung-Wan ; Park, Dong-Uk ; Yun, Da-Woon - p. 30-34 , 2019
 
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11

A 95.2% efficiency dual-path DC-DC step-up converter with c..:

, In: 2018 IEEE International Solid-State Circuits Conference - (ISSCC),
Shin, Se-Un ; Huh, Yeunhee ; Ju, Yongmin... - p. 430-432 , 2018
 
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12

Breakthrough of selector technology for cross-point 25-nm R..:

, In: 2017 IEEE International Electron Devices Meeting (IEDM),
Kim, Soo Gil ; Hwang, Hyun Mi ; Lee, Bo Mi... - p. 2.1.1-2.1.4 , 2017
 
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13

Analysis and modeling of resistive probes:

, In: 2006 IEEE Nanotechnology Materials and Devices Conference,
Kim, Sang Wan ; Choa, Sung-Hoon ; Lee, Jong Duk... - p. None , 2006
 
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14

Reliability and performance of hierarchical RAID with multi..:

, In: Proceedings of the twentieth annual ACM symposium on Principles of distributed computing,
 
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15

List of Contributors:

, In: Membrane-Based Salinity Gradient Processes for Water Treatment and Power Generation,
Amy, Gary ; Chae, Sung H. ; Chung, Tai-Shung... - p. ix-x , 2018
 
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