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X
Pashley, D.
11  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Mechanical stability of resin–dentine bonds:

, In: Dental Biomaterials,
PASHLEY, D. ; TAY, F. - p. 112-161 , 2008
Link: https://doi.org/10.1533/..
 
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2

Contributor contact details:

, In: Dental Biomaterials,
Curtis, Richard V. ; Watson, Timothy F. ; Darvell, B.W.... - p. xi-xiv , 2008
Link: https://doi.org/10.1016/..
 
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3

Etched Enamel Structure and Topography: Interface with Mate..:

, In: Dental Hard Tissues and Bonding,
Tay, F.R. ; Pashley, D.H. - p. 3-33 , 2005
Link: https://doi.org/10.1007/..
 
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4

Mobile computing in the retail arena:

, In: Proceedings of the SIGCHI Conference on Human Factors in Computing Systems,
Newcomb, Erica ; Pashley, Toni ; Stasko, John - p. 337-344 , 2003
Link: https://dl.acm.org/doi/1..
 
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5

Session 15 static RAMs [breaker page]:

, In: 1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Pashley, R. - p. 213 , 1984
Link: https://doi.org/10.1109/..
 
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6

Session 13 nonvolatile memory [breaker page]:

, In: 1983 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Pashley, R. - p. 161 , 1983
Link: https://doi.org/10.1109/..
 
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7

Session 18 static RAMs [breaker page]:

, In: 1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Pashley, R. - p. 247 , 1982
Link: https://doi.org/10.1109/..
 
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8

Session 1 static RAMs [breaker page]:

, In: 1981 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Pashley, R. - p. 11 , 1981
Link: https://doi.org/10.1109/..
 
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9

Limits of VLSI:

, In: 1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Pashley, R. ; Terman, L. - p. 191 , 1980
Link: https://doi.org/10.1109/..
 
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10

A 70-ns 1K MOS RAM:

, In: 1976 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Pashley, R. ; McCormick, G. - p. 138,139 , 1976
Link: https://doi.org/10.1109/..
 
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11

The structure of coherent and incoherent InAs/GaAs quantum ..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials,
Zhi, D ; Hÿtch, M J ; Dunin-Borkowski, R E... - p. 243-246 ,
Link: https://doi.org/10.1007/..
 
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