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2023 IEEE International Test Conference India (ITC India) ,
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Parallel Functional Test: A Case Study to Reduce Test Cost ..:
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2018 3rd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT) ,
2
Low Power Single Bit-line Power-gated SRAM:
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2018 3rd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT) ,
3
Optimization of Test Register Access Time for Next Generati..:
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2017 2nd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT) ,
4
Single bit-line low power 9T static random access memory:
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Reliability of Organic Compounds in Microelectronics and Optoelectronics ,
5
Degradation and Remaining Useful Life Prediction of Automot..:
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Reliability of Organic Compounds in Microelectronics and Optoelectronics ,
6
EMC Oxidation Under High-Temperature Aging:
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2023 IEEE Microwaves, Antennas, and Propagation Conference (MAPCON) ,
7
Study of Electromagnetic Interference Shielding Effectivene..:
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International Conference on Computer Vision and Internet of Things 2023 (ICCVIoT'23) ,
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