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Radu, T.
36  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

An Evaluation of Waste Management for Energy Recovery for B..:

, In: Sustainable Waste Management: Policies and Case Studies,
Blanchard, R. ; Albuflasa, H. ; Musa, I... - p. 247-261 , 2019
Link: https://doi.org/10.1007/..
 
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2

Neuroeconomics and Addiction:

, In: Biological Research on Addiction,
Radu, Peter T. ; McClure, Samuel M. - p. 413-423 , 2013
Link: https://doi.org/10.1016/..
 
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3

List of Contributors:

, In: Biological Research on Addiction,
Agrawal, Rajiv G. ; Amitai, Nurith ; Ares-Santos, Sara... - p. xi-xiv , 2013
Link: https://doi.org/10.1016/..
 
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4

An Open Hyperspectral Dataset with Sea-Land-Cloud Ground-Tr..:

, In: 2023 13th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS),
Justo, Jon A. ; Garrett, Joseph ; Langer, Dennis D.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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5

Barrier Booster for Remote Extension Doping and its DTCO fo..:

, In: 2023 International Electron Devices Meeting (IEDM),
Gilardi, Carlo ; Zeevi, Gilad ; Choi, Suhyeong... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Intercalated Graphene as Next Generation Back-end-of-Line C..:

, In: 2023 International Electron Devices Meeting (IEDM),
Li, S. W. ; Chan, Y. C. ; Hsu, C. H.... - p. i-iv , 2023
Link: https://doi.org/10.1109/..
 
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7

Evaluation of DMSO effects on cell electrical parameters us..:

, In: 2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC),
Tivig, I. ; Vallet, L. ; Moisescu, M. G.... - p. 1-3 , 2022
Link: https://doi.org/10.23919..
 
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8

Evidence of Tunneling Driven Random Telegraph Noise in Cryo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Michl, J. ; Grill, A. ; Stampfer, B.... - p. 31.3.1-31.3.4 , 2021
Link: https://doi.org/10.1109/..
 
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9

3D sequential integration: applications and associated key ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Batude, P. ; Billoint, O. ; Thuries, S.... - p. 3.2.1-3.2.4 , 2021
Link: https://doi.org/10.1109/..
 
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10

Reliability and Variability of Advanced CMOS Devices at Cry..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Grill, A. ; Bury, E. ; Michl, J.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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11

Quantum Mechanical Charge Trap Modeling to Explain BTI at C..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Michl, J. ; Grill, A. ; Claes, D.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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12

3D sequential low temperature top tier devices using dopant..:

, In: 2020 IEEE Symposium on VLSI Technology,
Vandooren, A. ; Wu, Z. ; Parihar, N.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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13

Technology evening panel discussion transistor future; How ..:

, In: 2017 Symposium on VLSI Technology,
Tsunomura, T. ; Mazure, C. ; Woo, J.... - p. T66-T66 , 2017
Link: https://doi.org/10.23919..
 
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14

Signal induced EMI in fibre channel cable-connector assembl..:

, In: 1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261),
Xu, M. ; Radu, S. ; Knighten, J.L.... - p. 201,202,203,204,205 , 1999
Link: https://doi.org/10.1109/..
 
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15

Contact Optimization Through Annealing and Edge Functionali..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Li, Meng-Zhan ; Hung, Terry Y.T. ; Yun, Wei Sheng... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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