Ramamurthy, K.
56  Ergebnisse:
Personensuche X
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1

Work in progress - collaborative multidisciplinary J-DSP so..:

, In: 2009 39th IEEE Frontiers in Education Conference,
 
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2

The Influences of the Degree of Interactivity on User-Outco..:

, In: Advances in Information Resources Management; Advanced Topics in Information Resources Management, Volume 2,
 
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5

Robust PSD features for ion-channel signals:

, In: Sensor Signal Processing for Defence (SSPD 2011),
 
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6

Analysis of Coulter counting data from nanopores using clus..:

, In: Sensor Signal Processing for Defence (SSPD 2010),
 
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8

List of contributors:

, In: Remote Sensing of Soils,
AbdelRahman, Mohamed A.E. ; Abinash, S. ; Adhikari, K.... - p. xvii-xxi , 2024
 
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11

A detailed comparison of various off-state breakdown method..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Joshi, K. ; Nminibapiel, D. ; Ghoneim, M.... - p. 1-6 , 2023
 
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12

Reliability Assessment of Double-Gated Wafer-Scale MoS2 Fie..:

, In: 2023 International Electron Devices Meeting (IEDM),
Provias, A. ; Knobloch, T. ; Kitamura, A.... - p. 1-4 , 2023
 
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13

Vibrio cholerae:

, In: Molecular Typing in Bacterial Infections, Volume II,
 
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14

Driving Impact in Claims Denial Management Using Artificial..:

, In: Communications in Computer and Information Science; Advances in Computing and Data Sciences,
Pal, Suman ; Gaur, Monica ; Chaudhuri, Rupanjali... - p. 107-120 , 2022
 
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15

Gate length scaling beyond Si: Mono-layer 2D Channel FETs R..:

, In: 2022 International Electron Devices Meeting (IEDM),
Dorow, C. J. ; Penumatcha, A. ; Kitamura, A.... - p. 7.5.1-7.5.4 , 2022
 
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