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1

Split-Gate CSTBT™ for Suppression of Negative Gate Capacita..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),

Sakaguchi, Kosuke ; Konishi, Kazuya ; Kobayashi, Ryosuke.. - p. 40-43 , 2024

Link: https://doi.org/10.1109/..

2

Reduction of Junction Temperature with Local Lifetime Contr..:

, In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD),

Sakaguchi, Kosuke ; Konishi, Kazuya ; Eguchi, Keisuke. - p. 215-218 , 2023

Link: https://doi.org/10.1109/..

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