Schattschneider, P
5  Ergebnisse:
Personensuche X
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1

Circular Dichroism in the Transmission Electron Microscope:

, In: Reference Module in Materials Science and Materials Engineering,
 
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2

Circular Dichroism in the Transmission Electron Microscope:

, In: Encyclopedia of Materials: Science and Technology,
 
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3

Removing Relativistic Effects in EELS for the Determination..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
 
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4

Contributors:

, In: Pain Management,
 
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5

Contributors:

, In: Pain Management,
 
1-5