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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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A 16 GB 1024 GB/s HBM3 DRAM with On-Die Error Control Schem..:
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2019 IEEE International Symposium on Broadband Multimedia Systems and Broadcasting (BMSB) ,
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Methodology for Analyzing ATSC 3.0 Single Frequency Network..:
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2019 International Conference on Information and Communication Technology Convergence (ICTC) ,
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Improvement in Deep Networks for Optimization Using eXplain..:
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2020 International Conference on Information and Communication Technology Convergence (ICTC) ,
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Where to Cut and Paste: Data Regularization with Selective ..:
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2020 International Conference on Information and Communication Technology Convergence (ICTC) ,
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Towards Understanding Architectural Effects on Knowledge Di..:
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2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS) ,
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MEMS Shock Absorbers Integrated with Al2O3-Reinforced, Mech..:
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2023 11th International IEEE/EMBS Conference on Neural Engineering (NER) ,
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Variability in Depolarization Sensitivity Underlies Differe..:
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2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) ,
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Differential Responses to High-Frequency Electrical Stimula..:
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2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) ,
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Response Profiles of Retinal Ganglion Cells to Sinusoidal E..:
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2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS) ,
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Measurement of Friction Force Between Directly Integrated C..:
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2019 9th International IEEE/EMBS Conference on Neural Engineering (NER) ,
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OFF Types of Mouse Retinal Ganglion Cells Are Less Sensitiv..:
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2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems ,
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Fabrication of Electrostatically-Actuated, In-Plane Fused Q..:
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2007 IEEE International Symposium on Circuits and Systems (ISCAS) ,
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Binary-Truncated CDMA-Based On-Chip Network:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Budgeting and predicting pattern defects using edge placeme..:
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
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