Silva, Mateus C.
216  Ergebnisse:
Personensuche X
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1

Edge Deep Learning Towards the Metallurgical Industry: Impr..:

, In: Enterprise Information Systems; Lecture Notes in Business Information Processing,
 
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2

Enabling Digital Twins in Industry 4.0:

, In: Enterprise Information Systems; Lecture Notes in Business Information Processing,
 
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3

Leaf shape reconstruction and damage estimation using a U-n..:

, In: Proceedings of the 36th Annual ACM Symposium on Applied Computing,
 
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4

Action and Assembly Time Measurement System of Industry Wor..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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5

Action Recognition of Industrial Workers using Detectron2 a..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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7

Automatic Video Labeling with Assembly Actions of Workers o..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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8

Automatically deciding on the integration of commits based ..:

, In: Proceedings of the 36th IEEE/ACM International Conference on Automated Software Engineering,
Fonseca, Samuel C. ; Lucena, Mateus C. ; Reis, Tiago M.... - p. 1131-1135 , 2021
 
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9

Automated Bright Pixel Detection System on LCD Displays:

, In: 2021 IEEE International Conference on Consumer Electronics (ICCE),
 
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10

Automatic Modulation Classification in Real Tx/Rx Environme..:

, In: 2021 IEEE International Conference on Consumer Electronics (ICCE),
 
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11

Dead Pixel Detection on Liquid Crystal Displays using Rando..:

, In: 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
 
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14

A Neurally Guided Patch-Based Style Transfer for Mobile Dev..:

, In: 2023 International Joint Conference on Neural Networks (IJCNN),
 
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15

The Easy Design Handoff Plugin and a CI/CD Pipeline for Aut..:

, In: 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON),
 
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