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Sterpone, L.
67  Ergebnisse:
Buchkapitel (Online) X
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1

Assessing Convolutional Neural Networks Reliability through..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Ruospo, A. ; Gavarini, G. ; de Sio, C.... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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2

Test, Reliability and Functional Safety Trends for Automoti..:

, In: 2022 IEEE European Test Symposium (ETS),
Angione, F. ; Appello, D. ; Aribido, J.... - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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3

Analysis and Mitigation of Soft-Errors on High Performance ..:

, In: 2022 21st International Symposium on Parallel and Distributed Computing (ISPDC),
Sterpone, L. ; Azimi, S. ; De Sio, C.. - p. 91-98 , 2022
Link: https://doi.org/10.1109/..
 
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4

A Neutron Generator Testing Platform for the Radiation Anal..:

, In: 2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Bozzoli, L. ; De Sio, C. ; Du, B.. - p. 1-5 , 2021
Link: https://doi.org/10.1109/..
 
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5

A Novel Propagation Model for Heavy-Ions Induced Single Eve..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Du, B. ; Colucci, M. ; Francola, S.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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6

RESCUE : interdependent challenges of reliability, secur..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Jenihhin, M. ; Hamdioui, S. ; Reorda, M. Sonza... - p. 388-393 , 2020
Link: https://dl.acm.org/doi/1..
 
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7

A dynamic reconfiguration mechanism to increase the reliabi..:

, In: 2020 IEEE 38th VLSI Test Symposium (VTS),
Rodriguez Condia, Josie E. ; Narducci, Pierpaolo ; Reorda, M. Sonza. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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8

RESCUE: Interdependent Challenges of Reliability, Security ..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Jenihhin, M. ; Hamdioui, S. ; Reorda, M. Sonza... - p. 388-393 , 2020
Link: https://doi.org/10.23919..
 
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9

A dynamic hardware redundancy mechanism for the in-field fa..:

, In: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS),
Rodriguez Condia, Josie E. ; Narducci, Pierpaolo ; Reorda, M. Sonza. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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10

An open source embedded-GPGPU model for the accurate analys..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Du, B. ; Condia, Josie E. Rodriguez ; Reorda, M. Sonza. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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11

On the evaluation of SEU effects in GPGPUs:

, In: 2019 IEEE Latin American Test Symposium (LATS),
Du, B. ; Rodriguez Condia, Josie E. ; Sonza Reorda, M.. - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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12

A new placement algorithm for the mitigation of multiple ce..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Sterpone, L. ; Battezzati, N. - p. 1231-1236 , 2010
Link: https://dl.acm.org/doi/1..
 
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13

A study of the single event effects impact on functional ma..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Abate, F. ; Sterpone, L. ; Violante, M.. - p. 1226-1229 , 2009
Link: https://dl.acm.org/doi/1..
 
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14

On the Static Cross Section of SRAM-Based FPGAs:

, In: 2008 IEEE Radiation Effects Data Workshop,
Manuzzato, A. ; Gerardin, S. ; Paccagnella, A... - p. None , 2008
Link: https://doi.org/10.1109/..
 
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15

On the design of tunable fault tolerant circuits on SRAM-ba..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Sterpone, L. ; Aguirre, M. ; Tombs, J.. - p. 336-341 , 2008
Link: https://dl.acm.org/doi/1..
 
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