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2020 IEEE International Reliability Physics Symposium (IRPS) ,
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STEM EBIC for High-Resolution Electronic Characterization:
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IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297) ,
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Demonstration of a high power W-band gyroklystron amplifier..:
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Entwicklung von Laborfermentoren ,
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Technologische Bewertung von Meßanordnungen und Meßgenauigk..:
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Notes on Numerical Fluid Mechanics and Multidisciplinary Design; New Results in Numerical and Experimental Fluid Mechanics XIV ,
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A Surrogate-Based $$e^N$$ Transition Prediction Method for ..:
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Lecture Notes in Computer Science; Computer Vision – ECCV 2022 ,
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Unpaired Image Translation via Vector Symbolic Architecture:
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Pattern Recognition and Artificial Intelligence; Lecture Notes in Computer Science ,
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Towards a Unified Benchmark for Monocular Radial Distortion..:
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Bedarfsgerechte fachmathematische Lehramtsausbildung; Konzepte und Studien zur Hochschuldidaktik und Lehrerbildung Mathematik ,
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Individuelle Curricula von Lehrkräften in der Algebra:
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Advances in Protein Molecular and Structural Biology Methods ,
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Advancements in the analysis of protein post-translational ..:
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Notes on Numerical Fluid Mechanics and Multidisciplinary Design; New Results in Numerical and Experimental Fluid Mechanics XIII ,
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Receptivity of Swept-Wing Boundary Layers to Surface Roughn..:
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Factors Affecting Neurodevelopment ,
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