Theodorou, Christoforos
13  Ergebnisse:
Personensuche X
?
1

Experimental Evidence of Light Source Contribution in the N..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
?
2

The Role of Tunneling Oxide in the Low Frequency Noise of M..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
?
3

Static and LFN/RTN Local and Global Variability Analysis Us..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
 
?
4

Applicability of the Carrier Number Fluctuations Model for ..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
?
5

Drain Current Variability in 2-levels Stacked Nanowire Gate..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
?
6

1/f and Random Telegraph Noise of Single-Layer Graphene Dev..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
?
7

Accounting for Current Degradation Effects in the Compact N..:

, In: 2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST),
 
?
8

In-depth electrical characterization of deca-nanometer InGa..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
 
?
10

Influence of series resistance on the experimental extracti..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
 
?
11

Impact of Inter-Tier Coupling on Static and Noise Performan..:

, In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
 
?
12

Low-frequency noise in surface-treated AlGaN/GaN HFETs:

, In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
Im, Ki-Sik ; Lee, Jun-Hyeok ; Lee, Jung-Hee... - p. 1-4 , 2018
 
1-13