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X
Tohru Yamaguchi
4  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Reliability issues of gate oxides and $p-n$ junctions for v..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Narita, Tetsuo ; Kikuta, Daigo ; Ito, Kenji... - p. 1-10 , 2023
Link: https://doi.org/10.1109/..
 
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2

Electrical and structural properties of Sn-doped $\alpha$-G..:

, In: 2019 Compound Semiconductor Week (CSW),
Mochizuki, Shuhei ; Yamaguchi, Tomohiro ; Onuma, Takeyoshi.. - p. 1-1 , 2019
Link: https://doi.org/10.1109/..
 
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3

Observation of Electroreflectance Spectra of $\beta$-Ga2O3 ..:

, In: 2019 Compound Semiconductor Week (CSW),
Onuma, Takeyoshi ; Tanaka, Kouya ; Sasaki, Kohei... - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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4

List of Contributors:

, In: Flow-induced Vibrations,
Fujikawa, Takeshi ; Hagiwara, Tsuyoshi ; Hayashi, Itsuro... - p. xiii-xiv , 2014
Link: https://doi.org/10.1016/..
 
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