Tournier, A.
76  Ergebnisse:
Personensuche X
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1

2.16µm Back Side Illuminated Voltage Domain Global Shutter ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Malinge, P. ; Lalanne, F. ; Herault, D.... - p. 1-4 , 2023
 
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2

$1.62\mu \mathrm{m}$ Global Shutter Quantum Dot Image Senso..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Steckel, J. S. ; Josse, E. ; Pattantyus-Abraham, A. G.... - p. 23.4.1-23.4.4 , 2021
 
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3

New mechanism of plasma induced damage on CMOS image sensor..:

, In: 2010 Proceedings of the European Solid State Device Research Conference,
Carrere, J.P. ; Oddou, J.P. ; Richard, C.... - p. 106-109 , 2010
 
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4

Source Code Archiving to the Rescue of Reproducible Deploym..:

, In: Proceedings of the 2nd ACM Conference on Reproducibility and Replicability,
 
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5

Solution of Time-Harmonic Maxwell's Equations by a Domain D..:

, In: Scientific Computing in Electrical Engineering; Mathematics in Industry,
 
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6

How Does the Partition of Unity Influence SORAS Preconditio..:

, In: Lecture Notes in Computational Science and Engineering; Domain Decomposition Methods in Science and Engineering XXVII,
 
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7

Technological and Research Challenges in Data Engineering f..:

, In: Proceedings of the International Workshop on Big Data in Emergent Distributed Environments,
 
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8

Numerical Assessment of PML Transmission Conditions in a Do..:

, In: Lecture Notes in Computational Science and Engineering; Domain Decomposition Methods in Science and Engineering XXVII,
 
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10

Microwave tomographic imaging of shoulder injury:

, In: 2023 17th European Conference on Antennas and Propagation (EuCAP),
 
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11

A Deep Learning Approach for Segmenting the Subplate and Pr..:

, In: Lecture Notes in Computer Science; Perinatal, Preterm and Paediatric Image Analysis,
 
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12

High-Performance Numerical Modeling for Detection of Rotato..:

, In: 2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI),
 
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13

RC delay mitigation for sub 700 nm hybrid bonding pitch:

, In: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC),
Lhostis, Sandrine ; Ayoub, Bassel ; Fremont, Helene... - p. 396-403 , 2023
 
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14

From Natural Language Requirements to the Verification of P..:

, In: Lecture Notes in Computer Science; NASA Formal Methods,
 
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