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Tyaginov, Stanislav
7  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

The properties, effect and extraction of localized defect p..:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Kaczer, Ben ; Tyaginov, Stanislav... - p. 1-7 , 2021
Link: https://doi.org/10.1109/..
 
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2

Modeling the Hysteresis of Current-Voltage Characteristics ..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Vasilev, Alexander ; Jech, Markus ; Grill, Alexander... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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3

A Compact Physics Analytical Model for Hot-Carrier Degradat..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Tyaginov, Stanislav ; Grill, Alexander ; Vandemaele, Michiel... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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4

The Influence of Gate Bias on the Anneal of Hot-Carrier Deg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Chuang, Kai-Hsin ; Bury, Erik... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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5

On Correlation between Hot-Carrier Stress Induced Device Pa..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Makarov, Alexander ; Roussel, Philippe ; Bury, Erik... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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6

A physics-aware compact modeling framework for transistor a..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Wu, Zhicheng ; Linten, Dimitri ; Kaczer, Ben... - p. 21.2.1-21.2.4 , 2019
Link: https://doi.org/10.1109/..
 
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7

Modeling of hot-carrier degradation: Physics and controvers..:

, In: 2012 IEEE International Integrated Reliability Workshop Final Report,
Tyaginov, Stanislav ; Grasser, Tibor - p. 206-215 , 2012
Link: https://doi.org/10.1109/..
 
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