Ueda, Osamu
12  Ergebnisse:
Personensuche X
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1

Grown-in defects and thermal instability affecting the reli..:

, In: Reliability of Semiconductor Lasers and Optoelectronic Devices,
Ueda, Osamu ; Tomiya, Shigetaka - p. 177-238 , 2021
 
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2

List of contributors:

, In: Reliability of Semiconductor Lasers and Optoelectronic Devices,
Bowers, John E. ; Caria, A. ; De Santi, C.... - p. xi , 2021
 
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3

Structural Properties 1: Characterization of Defects in β-G..:

, In: Gallium Oxide; Springer Series in Materials Science,
Ueda, Osamu - p. 349-363 , 2020
 
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4

Suppression of H2O absorption by hydrophobic-like surface o..:

, In: 2020 IEEE International Interconnect Technology Conference (IITC),
Ueda, Tetsuya ; Kiso, Osamu ; Abe, Shoji... - p. 100-102 , 2020
 
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5

List of contributors:

, In: Active Geophysical Monitoring,
 
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6

Numerical Sensitivity Study Compared to Trend of Experiment..:

, In: Model Tests and Numerical Simulations of Liquefaction and Lateral Spreading,
 
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7

LEAP-2017: Comparison of the Type-B Numerical Simulations w..:

, In: Model Tests and Numerical Simulations of Liquefaction and Lateral Spreading,
 
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8

List of Contributors:

, In: Plasma Medical Science,
Adachi, Tetsuo ; Akimoto, Yoshihiro ; Antoni, Vanni... - p. xiii-xvi , 2019
 
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9

LEAP-2017 Simulation Exercise: Calibration of Constitutive ..:

, In: Model Tests and Numerical Simulations of Liquefaction and Lateral Spreading,
 
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10

A Drive-by-Microwave isolated gate driver with a high-speed..:

, In: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD),
Nagai, Shuichi ; Kawai, Yasufumi ; Tabata, Osamu... - p. 434-437 , 2014
 
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11

Design an easy-to-use infection screening system for non-co..:

, In: 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society,
Sun, Guanghao ; Vinh, Nguyen Quang ; Matsuoka, Ayumu... - p. 4811-4814 , 2014
 
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12

List of Contributors:

, In: Handbook of Advanced Ceramics,
Abe, Masanori ; Adler, Joerg ; Adschiri, Tadafumi... - p. xxi-xxv , 2013
 
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