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Valea, Emanuele
6  Ergebnisse:
Buchkapitel (Online) X
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1

IEEE 1838 compliant scan encryption and integrity for 2.5/3..:

, In: 2024 IEEE European Test Symposium (ETS),
Suzano, Juan ; Chastand, Antoine ; Valea, Emanuele... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Correlation Electromagnetic Analysis on an FPGA Implementat..:

, In: 2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME),
Rodriguez, Rafael Carrera ; Bruguier, Florent ; Valea, Emanuele. - p. 217-220 , 2023
Link: https://doi.org/10.1109/..
 
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3

Improving the Fault Resilience of Neural Network Applicatio..:

, In: 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S),
Deligiannis, Nikolaos I. ; Cantoro, Riccardo ; Reorda, Matteo Sonza.. - p. 23-24 , 2022
Link: https://doi.org/10.1109/..
 
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4

A Secure Scan Controller for Protecting Logic Locking:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Nguyen, Quang-Linh ; Valea, Emanuele ; Flottes, Marie-Lise.. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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5

Evaluating the Code Encryption Effects on Memory Fault Resi..:

, In: 2020 IEEE Latin-American Test Symposium (LATS),
Cantoro, Riccardo ; Deligiannis, Nikolaos I. ; Reorda, Matteo Sonza.. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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6

Evaluating Data Encryption Effects on the Resilience of an ..:

, In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Cantoro, Riccardo ; Deligiannis, Nikolaos I. ; Reorda, Matteo Sonza.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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