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Wang, Shengcheng
180  Ergebnisse:
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1

COMB-MCM: Computing-on-Memory-Boundary NN Processor with Bi..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Zhu, Haozhe ; Jiao, Bo ; Zhang, Jinshan... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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2

Compact EM Models for Multi-Segment Interconnect Wires:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 121-151 , 2019
Link: https://doi.org/10.1007/..
 
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3

Automated Design Flow for Millimeter-Wave Antenna in Fan-Ou..:

, In: 2019 IEEE 21st Electronics Packaging Technology Conference (EPTC),
Wang, Shengcheng ; Rahul, Dutta ; Xie, Danpeng... - p. 448-451 , 2019
Link: https://doi.org/10.1109/..
 
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4

Reducing Processor Wearout by Exploiting the Timing Slack o..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 439-455 , 2019
Link: https://doi.org/10.1007/..
 
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5

ExtraTime: Modeling and Analysis of Transistor Aging at Mic..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 415-438 , 2019
Link: https://doi.org/10.1007/..
 
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6

Workload-Aware Static Aging Monitoring and Mitigation of Ti..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 373-399 , 2019
Link: https://doi.org/10.1007/..
 
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7

Learning-Based DRM and Energy Optimization for Manycore Dar..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 217-245 , 2019
Link: https://doi.org/10.1007/..
 
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8

EM Assessment for Power Grid Networks:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 153-175 , 2019
Link: https://doi.org/10.1007/..
 
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9

Cross-Layer DRM and Optimization for Datacenter Systems:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 263-275 , 2019
Link: https://doi.org/10.1007/..
 
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10

Aging Guardband Reduction Through Selective Flip-Flop Optim..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 357-372 , 2019
Link: https://doi.org/10.1007/..
 
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11

Dynamic EM Models for Transient Stress Evolution and Recove..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 97-120 , 2019
Link: https://doi.org/10.1007/..
 
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12

Recovery-Aware DRM for Near-Threshold Dark Silicon Processo..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 247-262 , 2019
Link: https://doi.org/10.1007/..
 
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13

Aging-Aware Timing Analysis:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 305-321 , 2019
Link: https://doi.org/10.1007/..
 
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14

Physics-Based EM Modeling:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 13-45 , 2019
Link: https://doi.org/10.1007/..
 
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15

Aging-Aware Standard Cell Library Optimization Methods:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 323-342 , 2019
Link: https://doi.org/10.1007/..
 
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