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2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs ,
3
Full understanding of hot-carrier-induced degradation in ST..:
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2006 International Electron Devices Meeting ,
6
High Performance 45-nm SOI Technology with Enhanced Strain,..:
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Encyclopedia of Materials: Science and Technology ,
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Polymer Glasses, Welding of: Processes and Mechanisms:
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Proceedings of 1994 IEEE 21st International Conference on Plasma Sciences (ICOPS) ,
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Radical And Ion Flux Uniformity In A L,ow Pressure Inductiv..:
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IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium ,
13