E-LIB Suche - Ergebnisse für: Xing, Pengju

1

Research on multi-modal data fusion technology based on aut..:

, In: 2023 3rd International Symposium on Artificial Intelligence and Intelligent Manufacturing (AIIM),

Cong, Zhuang ; Wang, Ting ; Bi, Meng... - p. 34-38 , 2023

Link: https://doi.org/10.1109/..

2

A Semi-Physical Model of SiC MOSFETs for Improved Static Ch..:

, In: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC),

Liu, Qingsong ; Sun, Pengju ; Peng, Guoxiu. - p. 1842-1845 , 2024

Link: https://doi.org/10.1109/..

3

A Gate-Oxide Degradation Monitoring Method of SiC MOSFETs B..:

, In: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC),

Zhou, Xinghao ; Sun, Pengju ; Peng, Guoxiu. - p. 2809-2812 , 2024

Link: https://doi.org/10.1109/..

4

Review on the Thermal Parameters Applications in the Reliab..:

, In: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC),

Shen, Huixian ; Zhang, Jun ; Sun, Pengju. - p. 4482-4487 , 2024

Link: https://doi.org/10.1109/..

5

Condition Monitoring the Inhomogeneous Thermal Fatigue of M..:

, In: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia),

Zhang, Jun ; Shen, Huixian ; Sun, Pengju. - p. 2648-2653 , 2024

Link: https://doi.org/10.1109/..

6

Thermal Control of SiC Module Based on the Feedback of Life..:

, In: 2023 IEEE Energy Conversion Congress and Exposition (ECCE),

Zhang, Jun ; Du, Xiong ; Sun, Pengju... - p. 5771-5775 , 2023

Link: https://doi.org/10.1109/..

7

A Novel Time-Sharing Conduction Method for Improving SiC MO..:

, In: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS),

Lan, Yufeng ; Sun, Pengju ; Li, Qiang... - p. 1922-1926 , 2023

Link: https://doi.org/10.1109/..

8

Gate-Oxide Degradation Monitoring of SiC MOSFET Based on th..:

, In: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS),

Yang, Yinghui ; Sun, Pengju ; Ma, Xing... - p. 1938-1941 , 2023

Link: https://doi.org/10.1109/..

9

Impact of Short-Circuit Events on the Threshold Voltage Ins..:

, In: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS),

Li, Kaiwei ; Sun, Pengju ; Ma, Xing... - p. 1874-1878 , 2023

Link: https://doi.org/10.1109/..

10

A Gate Voltage Clamping Method to Improve the Short-Circuit..:

, In: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS),

Ouyang, Wenyuan ; Sun, Pengju ; Xie, Minghang.. - p. 287-292 , 2023

Link: https://doi.org/10.1109/..