Yang, Wenkuan
6  Ergebnisse:
Personensuche X
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1

Ge Single-Crystal-Island (Ge-SCI) Technique and BEOL Ge Fin..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Chung, Hao-Tung ; Shih, Bo-Jheng ; Yang, Chih-Chao... - p. 34.5.1-34.5.4 , 2021
 
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3

Substrate Bias Effect on Dynamic Characteristics of a Monol..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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5

Monolithic 3D BEOL FinFET switch arrays using location-cont..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Hsieh, Ping-Yi ; Huang, Chien-Chi ; Tai, Ming-Chi... - p. 3.1.1-3.1.4 , 2019
 
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6

A numerical study of Si-TMD contact with n/p type operation..:

, In: 2016 IEEE International Electron Devices Meeting (IEDM),
Tang, Ying-Tsan ; Li, Kai-Shin ; Li, Lain-Jong... - p. 14.3.1-14.3.4 , 2016
 
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