E-LIB Suche - Ergebnisse für: You, W C

1

Complementary Field-Effect Transistor (CFET) Demonstration ..:

, In: 2023 International Electron Devices Meeting (IEDM),

Liao, S. ; Yang, L. ; Chiu, T.K.... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

2

Contributors:

, In: Clinical Radiation Oncology,

Abrams, Ross A. ; Alonso-Basanta, Michelle ; Anderson, Bethany M.... - p. vii-xvii , 2012

Link: https://doi.org/10.1016/..

3

Construction of the Shewhart Median Chart Based on the Expe..:

, In: 2023 IEEE 13th International Conference on Control System, Computing and Engineering (ICCSCE),

Chong, Z. L. ; Teoh, W. L. ; You, H. W... - p. 33-38 , 2023

Link: https://doi.org/10.1109/..

4

Nonlinear optical properties of 2D materials:

, In: Reference Module in Materials Science and Materials Engineering,

You, Jian W. ; Panoiu, Nicolae C. , 2023

Link: https://doi.org/10.1016/..

5

Optically and Chemically Controllable Light Flow in Topolog..:

, In: 2022 Photonics & Electromagnetics Research Symposium (PIERS),

Wang, Y. ; You, J. W. ; Lan, Z.. - p. 204-208 , 2022

Link: https://doi.org/10.1109/..

6

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022

Link: https://doi.org/10.1109/..

7

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022

Link: https://doi.org/10.1109/..

8

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,

Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020

Link: https://doi.org/10.1109/..

9

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,

Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020

Link: https://doi.org/10.1109/..

10

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020

Link: https://doi.org/10.1109/..

11

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),

Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019

Link: https://doi.org/10.1109/..

12

Contributors:

, In: Biomarkers in Toxicology,

Anadón, Arturo ; Anantharam, Vellareddy ; Archibong, Anthony E.... - p. xix-xxii , 2019

Link: https://doi.org/10.1016/..

13

A 0.9V 92dB Double-Sampled Switched-RC SD Audio ADC:

, In: 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.,

Ahn, G.-C. ; Hanumolu, P. ; Lee, S.-H.... - p. 160-161 , 2006

Link: https://doi.org/10.1109/..

14

Contributing Authors:

, In: Nutritional Oncology,

Aktas, Huseyin ; Albanes, Demetrius ; Augenlicht, Leonard... - p. xiii-xvi , 2006

Link: https://doi.org/10.1016/..

15

Contributors:

, In: Sinusoidal Cells in Liver Diseases,

Andrade, Raúl J. ; Babuta, Mrigya ; Baiocchi, Leonardo... - p. xv-xviii , 2024

Link: https://doi.org/10.1016/..