Personensuche
X
?
2023 International Electron Devices Meeting (IEDM) ,
1
Complementary Field-Effect Transistor (CFET) Demonstration ..:
, In:
?
2023 IEEE 13th International Conference on Control System, Computing and Engineering (ICCSCE) ,
3
Construction of the Shewhart Median Chart Based on the Expe..:
, In:
?
Reference Module in Materials Science and Materials Engineering ,
4
Nonlinear optical properties of 2D materials:
, In:
?
2022 Photonics & Electromagnetics Research Symposium (PIERS) ,
5
Optically and Chemically Controllable Light Flow in Topolog..:
, In:
?
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
6
STT-MRAM Product Reliability and Cross-Talk:
, In:
?
2022 IEEE International Reliability Physics Symposium (IRPS) ,
7
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:
, In:
?
2020 IEEE Symposium on VLSI Technology ,
8
A Reliable TDDB Lifetime Projection Model Verified Using 40..:
, In:
?
2020 IEEE Symposium on VLSI Technology ,
9
Fast Switching of STT-MRAM to Realize High Speed Applicatio..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
10
Magnetic Immunity Guideline for Embedded MRAM Reliability t..:
, In:
?
2019 IEEE International Electron Devices Meeting (IEDM) ,
11
Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:
, In:
?
2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. ,
13