chou, C.-T.
235  Ergebnisse:
Personensuche X
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Contributors:

, In: Pain Management,
 
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Continuous media communication with dynamic QOS control usi..:

, In: Conference proceedings on Communications architectures & protocols,
 
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Complementary Field-Effect Transistor (CFET) Demonstration ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Liao, S. ; Yang, L. ; Chiu, T.K.... - p. 1-4 , 2023
 
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Investigation of Defect Engineering Toward Prolonged Endura..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lee, J.H. ; Chou, C.H. ; Liao, P.J.... - p. 32.6.1-32.6.4 , 2022
 
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Anti-plane Response Induced by a Partially Filled Trapezoid..:

, In: Lecture Notes in Civil Engineering; EASEC16,
Shyu, W. S. ; Teng, T. J. ; Chou, C. S. - p. 319-328 , 2020
 
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High performance 22/20nm FinFET CMOS devices with advanced ..:

, In: 2010 International Electron Devices Meeting,
Wu, C.C. ; Cheng, M.L. ; Li, T.H.... - p. 27.1.1-27.1.4 , 2010
 
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Device Study on OTS-PCM for Persistent Memory Application :..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chien, W. C. ; Gignac, L. M. ; Chou, Y. C.... - p. 327-329 , 2022
 
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A Value-Added Health Systems Science Intervention Based on ..:

, In: The Medical/Health Humanities-Politics, Programs, and Pedagogies,
 
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Patient Co-Participation in Narrative Medicine Curricula as..:

, In: The Medical/Health Humanities-Politics, Programs, and Pedagogies,
 
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Optimizing AsSeGe Chalcogenides by Dopants for Extremely Lo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Cheng, H. Y. ; Chien, W C. ; Kuo, I. T.... - p. 28.6.1-28.6.4 , 2021
 
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Si Incorporation Into AsSeGe Chalcogenides for High Thermal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Cheng, H. Y. ; Kuo, I. T. ; Chien, W C.... - p. 1-2 , 2020
 
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Growth and characterization of III-nitride based multiple q..:

, In: 2012 38th IEEE Photovoltaic Specialists Conference,
Wadekar, P. V. ; Huang, H.C. ; Chang, C. W.... - p. 001937-001939 , 2012
 
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The Effect of Gate Current on the Degradation of GaAs PHEMT..:

, In: [Reliability of Compound Semiconductors] ROCS Workshop 2006,
Chou, Y. C. ; Chin, P. ; Wojtowicz, M.... - p. None , 2006
 
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The effect of elevated temperature lifetest on low frequenc..:

, In: JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004.,
Chou, Y.C. ; Eng, D. ; Block, T.... - p. 69,70,71,72,73,74,75,76,77,78,79 , 2004
 
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