van Tendeloo, G.
21  Ergebnisse:
Personensuche X
?
1

Transmission electron microscopy characterisation of Ti and..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials,
Van Daele, B ; Van Tendeloo, G ; Ruythooren, W... - p. 389-392 , 2005
 
1-15