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X
van der Veen, A.Y
5  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Three-Layer BEOL Process Integration with Supervia and Self..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Vega-Gonzalez, V. ; Bekaert, J. ; Kesters, E.... - p. 19.3.1-19.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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2

Development of Stop Criteria for Proof Loading:

, In: Life-Cycle of Engineering Systems: Emphasis on Sustainable Civil Infrastructure,
Lantsoght, E.O.L. ; Yang, Y. ; Tersteeg, R.H.D... - p. 1064-1071 , 2016
Link: https://doi.org/10.1201/..
 
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3

Development of Stop Criteria for Proof Loading:

, In: Life-Cycle of Engineering Systems,
Lantsoght, E.O.L. ; Yang, Y. ; Tersteeg, R.H.D... - p. 1064-1071 , 2016
Link: https://doi.org/10.1201/..
 
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4

Exploring the Reliability Limits for the Z-Pitch Scaling of..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Tiernc, D. ; Arreghini, A. ; Lesniewska, A.... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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5

Selective ALD Mo Deposition in 10nm Contacts:

, In: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM),
van der Veen, Marleen H. ; Maes, J. W. ; Pedreira, O. Varela... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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