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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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Effects of Collected Charge and Drain Area on SE Response o..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
3
Single-Event Latchup Vulnerability at the 7-nm FinFET Node:
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2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
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Micro-Latchup Location and Temperature Characterization in ..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
5
High-Current State triggered by Operating-Frequency Change:
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IEEE Nuclear Science Symposuim & Medical Imaging Conference ,
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Progress in the development of a Plasma Panel Detector:
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2005 8th European Conference on Radiation and Its Effects on Components and Systems ,
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Simulating Nuclear Events in a TCAD Model of a High-Density..:
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1991 IEEE International Symposium on Circuits and Systems (ISCAS) ,
10
Simulation of acquisition in phase-locked loops incorporati..:
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1965 IEEE International Solid-State Circuits Conference. Digest of Technical Papers ,
11
The use of insulated-gate field-effect transistors in digit..:
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Proceedings of the December 4-6, 1962, fall joint computer conference ,
12
On the use of the SOLOMON parallel-processing computer:
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Biology of Growing Animals; Biology of Metabolism in Growing Animals ,
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