Rudolph, R
13129  Ergebnisse:
Personensuche X
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5

Scanning spreading resistance microscopy for failure analys..:

Doering, S. ; Rudolf, R. ; Pinkert, M....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2128-2132 , 2014
 
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7

HCS degradation of 5nm oxide high-voltage PLDMOS:

Olk, C. ; Aresu, S. ; Rudolf, R....
Microelectronics Reliability.  54 (2014)  9-10 - p. 1883-1886 , 2014
 
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8

Determination of microstructural changes by severely plasti..:

Romcevic, N. ; Gilic, M. ; Anzel, I....
Journal of Mining and Metallurgy, Section B: Metallurgy.  50 (2014)  1 - p. 61-68 , 2014
 
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10

Relationship between activity of silica thin films and dens..:

Jokanović, V. ; Čolović, B. ; Jokanović, B...
Journal of Biomedical Materials Research Part A.  102 (2013)  6 - p. 1707-1714 , 2013
 
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11

348 Validation of CRP as prognostic marker for renal cell c..:

Steffens, S. ; Köhler, A. ; Rudolph, R....
European Urology Supplements.  12 (2013)  1 - p. e348 , 2013
 
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12

Micro and nano-CT as a valuable and complimentary tool for ..:

Faillace, M.E. ; Rudolph, R.A. ; Brunke, O.
Microscopy and Microanalysis.  19 (2013)  S2 - p. 636-637 , 2013
 
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13

Advances in High-Resolution X-Ray Computed Tomography: Comp..:

Rudolph, R. ; Williams, A. ; Brunke, O.
Microscopy and Microanalysis.  18 (2012)  S2 - p. 576-577 , 2012
 
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14

Single pulse energy capability and failure modes of n- and ..:

Podgaynaya, A. ; Rudolf, R. ; Elattari, B....
Microelectronics Reliability.  50 (2010)  9-11 - p. 1347-1351 , 2010
 
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15

Far-infrared study of impurity local modes in Co-doped PbTe:

Trajić, J. ; Romčević, N. ; Romčević, M....
Journal of Alloys and Compounds.  493 (2010)  1-2 - p. 41-46 , 2010
 
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