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Beleniotis, Petros
5  Ergebnisse:
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1

Investigation of Traps Impact on PAE and Linearity of AlGaN..:

Beleniotis, Petros ; Zervos, Christos ; Krause, Sascha...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3582-3589 , 2024
Link: https://doi.org/10.1109/..
 
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2

A computational analysis on the impact of thin undoped chan..:

Zervos, Christos ; Beleniotis, Petros ; Rudolph, Matthias
Semiconductor Science and Technology.  , 2024
Link: https://doi.org/10.1088/..
 
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3

A Physics-Based Model for Slow Gate-Induced Electron Trappi..:

Beleniotis, Petros ; Krause, Sascha ; Zervos, Christos.
IEEE Transactions on Electron Devices.  71 (2024)  7 - p. 4058-4065 , 2024
Link: https://doi.org/10.1109/..
 
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4

Importance of Scaling in RF GaN HEMTs for Reduction of Surf..:

Yazdani, Hossein ; Zervos, Christos ; Beleniotis, Petros...
physica status solidi (a).  , 2024
Link: https://doi.org/10.1002/..
 
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5

An efficient drain-lag model for microwave GaN HEMTs based ..:

Beleniotis, Petros ; Schnieder, Frank ; Krause, Sascha..
International Journal of Microwave and Wireless Technologies.  14 (2021)  2 - p. 134-142 , 2021
Link: https://doi.org/10.1017/..
 
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