E-LIB Suche - Ergebnisse für: Bonnafé, J.

1

Étude clinico-radiologique des déformations du crâne dans l..:

Captier, G ; Leboucq, N ; Bigorre, M...
Archives de Pédiatrie. 10 (2003) 3 - p. 208-214 , 2003

Link: https://doi.org/10.1016/..

2

Micro-optomechanical sensor for optical connection in the n..:

Belier, B. ; Santoso, A. ; Bonnafe, J....
Applied Physics Letters. 77 (2000) 12 - p. 1768-1770 , 2000

Link: https://doi.org/10.1063/..

3

A study of semiconductor surfaces and devices by coupled IR..:

Gall-Borrut, P. ; Castagne, M. ; Weyher, J.L...
Ultramicroscopy. 71 (1998) 1-4 - p. 231-234 , 1998

Link: https://doi.org/10.1016/..

4

A model for the mechanism of field interaction at silicon A..:

Fillard, Jean-Pierre ; Castagné, Michel ; Prioleau, Christel..
Ultramicroscopy. 61 (1995) 1-4 - p. 85-89 , 1995

Link: https://doi.org/10.1016/..

5

Photon tunneling from semiconductor surfaces to atomic forc..:

Fillard, J.P. ; Castagné, M. ; Prioleau, C....
Materials Science and Engineering: B. 28 (1994) 1-3 - p. 493-496 , 1994

Link: https://doi.org/10.1016/..

6

A comparison of the thermal and near band-gap light-induced..:

Alvarez, A. ; Jiménez, J. ; Chafai, M...
Journal of Applied Physics. 73 (1993) 10 - p. 5004-5008 , 1993

Link: https://doi.org/10.1063/..

7

Recognition and mapping of microdefects by photoetching, la..:

Weyher, J L ; Gall, P ; Dang, Le Si...
Semiconductor Science and Technology. 7 (1992) 1A - p. A45-A52 , 1992

Link: https://doi.org/10.1088/..

8

Photocurrent study of the influence of photogenerated carri..:

Chafai, M. ; Jiménez, J. ; Alvárez, A..
Applied Physics Letters. 60 (1992) 10 - p. 1253-1255 , 1992

Link: https://doi.org/10.1063/..

9

Qualification by optical means of CdTe substrates:

Triboulet, R. ; Durand, A. ; Gall, P....
Journal of Crystal Growth. 117 (1992) 1-4 - p. 227-232 , 1992

Link: https://doi.org/10.1016/..

10

Laser-scanning tomography: a survey of recent investigation..:

Fillard, J P ; Gall, P ; Bonnafe, J..
Semiconductor Science and Technology. 7 (1992) 1A - p. A283-A287 , 1992

Link: https://doi.org/10.1088/..

11

Submicron optical sectioning microscopy: A particular inver..:

Fillard, J.P. ; Montgomery, P.C. ; Gall, P...
Journal of Crystal Growth. 103 (1990) 1-4 - p. 120-125 , 1990

Link: https://doi.org/10.1016/..

12

High resolution and sensitivity infrared tomography:

Fillard, J.P. ; Montgomery, P.C. ; Gall, P...
Journal of Crystal Growth. 103 (1990) 1-4 - p. 109-115 , 1990

Link: https://doi.org/10.1016/..

13

0.8 eV excitation of the quenched EL2* level in semi-insula..:

Jiménez, J. ; Alvárez, A. ; Gonzalez, M. A..
Journal of Applied Physics. 66 (1989) 5 - p. 2221-2222 , 1989

Link: https://doi.org/10.1063/..

14

An analysis of the oxygen condensation processes in silicon..:

Gall, P. ; Bonnafé, J. ; Fillard, J.P...
Materials Science and Engineering: B. 4 (1989) 1-4 - p. 483-487 , 1989

Link: https://doi.org/10.1016/..

15

Optical recovery of the 1–1.3 eV photocurrent by 1.45eV pho..:

Alvarez, A. ; Jiménez, J. ; Bonnafé, J..
Solid State Communications. 72 (1989) 8 - p. 781-783 , 1989

Link: https://doi.org/10.1016/..