Castellazzi, Am
406  Ergebnisse:
Personensuche X
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4

Reliable development of an IMS-based SiC power module:

Lee, Y. ; Avilès, S. ; Fukunaga, S....
Microelectronics Reliability.  150 (2023)  - p. 115164 , 2023
 
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9

Experimentally validated methodology for real-time temperat..:

Stella, F. ; Olanrewaju, O. ; Yang, Z...
Microelectronics Reliability.  88-90 (2018)  - p. 615-619 , 2018
 
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10

Avalanche ruggedness of parallel SiC power MOSFETs:

Fayyaz, A. ; Asllani, B. ; Castellazzi, A...
Microelectronics Reliability.  88-90 (2018)  - p. 666-670 , 2018
 
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11

GaN transistors efficient cooling by graphene foam:

Antonini, M. ; Cova, P. ; Delmonte, N..
Microelectronics Reliability.  88-90 (2018)  - p. 812-816 , 2018
 
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12

Impact of underfill and other physical dimensions on Silico..:

Rajaguru, P. ; Lu, H. ; Bailey, C....
Microelectronics Reliability.  83 (2018)  - p. 146-156 , 2018
 
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13

Thermal design and characterization of a modular integrated..:

Cova, P. ; Aliyu, A.M. ; Castellazzi, A....
Microelectronics Reliability.  76-77 (2017)  - p. 277-281 , 2017
 
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15

Thermal design optimization of novel modular power converte..:

Cova, P. ; Delmonte, N. ; Solomon, A.K..
Microelectronics Reliability.  64 (2016)  - p. 507-512 , 2016
 
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