E-LIB Suche - Ergebnisse für: Chaudhuri, Arjun

1

Design-for-Test Solutions for 3D Integrated Circuits*:

Hung, Shao-Chun ; Bhoumik, Partho ; Chaudhuri, Arjun..
Integrated Circuits and Systems. , 2024

2

Fault Diagnosis for Resistive Random Access Memory and Mono..:

Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 32 (2024) 7 - p. 1336-1349 , 2024

Link: https://doi.org/10.1109/..

3

TaintLock: Hardware IP Protection Against Oracle-Guided and..:

Talukdar, Jonti ; Chaudhuri, Arjun ; Ortega, Eduardo.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. , 2024

Link: https://doi.org/10.1109/..

4

Built-In Self-Test of High-Density and Realistic ILV Layout..:

Chaudhuri, Arjun ; Banerjee, Sanmitra ; Kim, Jinwoo..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31 (2023) 3 - p. 296-309 , 2023

Link: https://doi.org/10.1109/..

5

Transferable Graph Neural Network-Based Delay-Fault Localiz..:

Hung, Shao-Chun ; Banerjee, Sanmitra ; Chaudhuri, Arjun...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 11 - p. 4296-4309 , 2023

Link: https://doi.org/10.1109/..

6

Bargain effectiveness in differentiated store environments:..:

Doucé, Lieve ; Willems, Kim ; Chaudhuri, Arjun
Journal of Retailing and Consumer Services. 69 (2022) - p. 103085 , 2022

Link: https://doi.org/10.1016/..

7

C-Testing and Efficient Fault Localization for AI Accelerat..:

Chaudhuri, Arjun ; Liu, Chunsheng ; Fan, Xiaoxin.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41 (2022) 7 - p. 2348-2361 , 2022

Link: https://doi.org/10.1109/..

8

Variation-Aware Delay Fault Testing for Carbon-Nanotube FET..:

Banerjee, Sanmitra ; Chaudhuri, Arjun ; Ning, August.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29 (2021) 2 - p. 409-422 , 2021

Link: https://doi.org/10.1109/..

9

Built-in Self-Test and Fault Localization for Inter-Layer V..:

Chaudhuri, Arjun ; Banerjee, Sanmitra ; Kim, Jinwoo...
ACM Journal on Emerging Technologies in Computing Systems. 18 (2021) 1 - p. 1-37 , 2021

Link: https://doi.org/10.1145/..

10

Design Automation and Test Solutions for Monolithic 3D ICs:

Zhu, Lingjun ; Chaudhuri, Arjun ; Banerjee, Sanmitra...
ACM Journal on Emerging Technologies in Computing Systems. 18 (2021) 1 - p. 1-49 , 2021

Link: https://doi.org/10.1145/..

11

Analysis of the Impact of Process Variations and Manufactur..:

Banerjee, Sanmitra ; Chaudhuri, Arjun ; Chakrabarty, Krishnendu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28 (2020) 6 - p. 1513-1526 , 2020

Link: https://doi.org/10.1109/..

12

The moderating roles of shopper experience and store type o..:

Ligas, Mark ; Chaudhuri, Arjun
Journal of Retailing and Consumer Services. 19 (2012) 2 - p. 249-258 , 2012

Link: https://doi.org/10.1016/..

13

The effect of hedonic and utilitarian verbal descriptions a..:

Chaudhuri, Arjun ; Micu, Camelia Codruta
Journal of Marketing Communications. 20 (2012) 5 - p. 307-324 , 2012

Link: https://doi.org/10.1080/..

14

Emotional Responses on Initial Exposure to a Hedonic or Uti..:

Chaudhuri, Arjun ; Aboulnasr, Khaled ; Ligas, Mark
Journal of Marketing Theory and Practice. 18 (2010) 4 - p. 339-359 , 2010

Link: https://doi.org/10.2753/..

15

EMOTIONAL RESPONSES ON INITIAL EXPOSURE TO A HEDONIC OR UTI..:

Chaudhuri, Arjun ; Aboulnasr, Khaled ; Ligas, Mark.
Journal of Marketing Theory and Practice. 18 (2010) 4 - p. 339-359 , 2010

Link: http://dx.doi.org/10.275..