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Chaudhuri, Arjun
43
Ergebnisse:
Artikel (Online) X
Personensuche
X
Sortierung: Relevanz
Sortierung: Jahr
?
1
Design-for-Test Solutions for 3D Integrated Circuits*:
Hung, Shao-Chun
;
Bhoumik, Partho
;
Chaudhuri, Arjun
..
Integrated Circuits and Systems. , 2024
Link:
https://doi.org/10.23919..
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2
Fault Diagnosis for Resistive Random Access Memory and Mono..:
Hung, Shao-Chun
;
Chaudhuri, Arjun
;
Banerjee, Sanmitra
.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 32 (2024) 7 - p. 1336-1349 , 2024
Link:
https://doi.org/10.1109/..
?
3
TaintLock: Hardware IP Protection Against Oracle-Guided and..:
Talukdar, Jonti
;
Chaudhuri, Arjun
;
Ortega, Eduardo
.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. , 2024
Link:
https://doi.org/10.1109/..
?
4
Built-In Self-Test of High-Density and Realistic ILV Layout..:
Chaudhuri, Arjun
;
Banerjee, Sanmitra
;
Kim, Jinwoo
..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31 (2023) 3 - p. 296-309 , 2023
Link:
https://doi.org/10.1109/..
?
5
Transferable Graph Neural Network-Based Delay-Fault Localiz..:
Hung, Shao-Chun
;
Banerjee, Sanmitra
;
Chaudhuri, Arjun
...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 11 - p. 4296-4309 , 2023
Link:
https://doi.org/10.1109/..
?
6
Bargain effectiveness in differentiated store environments:..:
Doucé, Lieve
;
Willems, Kim
;
Chaudhuri, Arjun
Journal of Retailing and Consumer Services. 69 (2022) - p. 103085 , 2022
Link:
https://doi.org/10.1016/..
?
7
C-Testing and Efficient Fault Localization for AI Accelerat..:
Chaudhuri, Arjun
;
Liu, Chunsheng
;
Fan, Xiaoxin
.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41 (2022) 7 - p. 2348-2361 , 2022
Link:
https://doi.org/10.1109/..
?
8
Variation-Aware Delay Fault Testing for Carbon-Nanotube FET..:
Banerjee, Sanmitra
;
Chaudhuri, Arjun
;
Ning, August
.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29 (2021) 2 - p. 409-422 , 2021
Link:
https://doi.org/10.1109/..
?
9
Built-in Self-Test and Fault Localization for Inter-Layer V..:
Chaudhuri, Arjun
;
Banerjee, Sanmitra
;
Kim, Jinwoo
...
ACM Journal on Emerging Technologies in Computing Systems. 18 (2021) 1 - p. 1-37 , 2021
Link:
https://doi.org/10.1145/..
?
10
Design Automation and Test Solutions for Monolithic 3D ICs:
Zhu, Lingjun
;
Chaudhuri, Arjun
;
Banerjee, Sanmitra
...
ACM Journal on Emerging Technologies in Computing Systems. 18 (2021) 1 - p. 1-49 , 2021
Link:
https://doi.org/10.1145/..
?
11
Analysis of the Impact of Process Variations and Manufactur..:
Banerjee, Sanmitra
;
Chaudhuri, Arjun
;
Chakrabarty, Krishnendu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28 (2020) 6 - p. 1513-1526 , 2020
Link:
https://doi.org/10.1109/..
?
12
The moderating roles of shopper experience and store type o..:
Ligas, Mark
;
Chaudhuri, Arjun
Journal of Retailing and Consumer Services. 19 (2012) 2 - p. 249-258 , 2012
Link:
https://doi.org/10.1016/..
?
13
The effect of hedonic and utilitarian verbal descriptions a..:
Chaudhuri, Arjun
;
Micu, Camelia Codruta
Journal of Marketing Communications. 20 (2012) 5 - p. 307-324 , 2012
Link:
https://doi.org/10.1080/..
?
14
Emotional Responses on Initial Exposure to a Hedonic or Uti..:
Chaudhuri, Arjun
;
Aboulnasr, Khaled
;
Ligas, Mark
Journal of Marketing Theory and Practice. 18 (2010) 4 - p. 339-359 , 2010
Link:
https://doi.org/10.2753/..
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15
EMOTIONAL RESPONSES ON INITIAL EXPOSURE TO A HEDONIC OR UTI..:
Chaudhuri, Arjun
;
Aboulnasr, Khaled
;
Ligas, Mark
.
Journal of Marketing Theory and Practice. 18 (2010) 4 - p. 339-359 , 2010
Link:
http://dx.doi.org/10.275..
1-15