E-LIB Suche - Ergebnisse für: De Santi, C.

1

Review and Outlook on GaN and SiC Power Devices: Industrial..:

Buffolo, M. ; Favero, D. ; Marcuzzi, A....
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1344-1355 , 2024

2

Origin and Recovery of Negative VTH Shift on 4H–SiC MOS Cap..:

Marcuzzi, A. ; Avramenko, M. ; De Santi, C....
Materials Science in Semiconductor Processing. 177 (2024) - p. 108389 , 2024

Link: https://doi.org/10.1016/..

3

Degradation of AlGaN-based UV-C SQW LEDs analyzed by means ..:

Piva, F. ; Pilati, M. ; Buffolo, M....
Applied Physics Letters. 122 (2023) 18 - p. , 2023

Link: https://doi.org/10.1063/..

4

Bias-dependent degradation of single quantum well on InGaN-..:

Casu, C. ; Buffolo, M. ; Caria, A....
Microelectronics Reliability. 150 (2023) - p. 115132 , 2023

Link: https://doi.org/10.1016/..

5

Early failure of high-power white LEDs for outdoor applicat..:

Caria, A. ; Fraccaroli, R. ; Pierobon, G....
Microelectronics Reliability. 150 (2023) - p. 115142 , 2023

Link: https://doi.org/10.1016/..

6

Trade-off between gate leakage current and threshold voltag..:

Favero, D. ; De Santi, C. ; Stockman, A....
Microelectronics Reliability. 150 (2023) - p. 115129 , 2023

Link: https://doi.org/10.1016/..

7

Screening medical students for SARS-CoV-2 to facilitate fac..:

De Santi, C. ; Cavalleri, G.L. ; Kerrigan, S.W....
Journal of Hospital Infection. 135 (2023) - p. 1-3 , 2023

Link: https://doi.org/10.1016/..

8

Impact of high-temperature operating lifetime tests on the ..:

Pilati, M. ; Buffolo, M. ; Rampazzo, F....
Microelectronics Reliability. 150 (2023) - p. 115131 , 2023

Link: https://doi.org/10.1016/..

9

Threshold voltage instability in SiO2-gate semi-vertical Ga..:

Fregolent, M. ; Del Fiol, A. ; De Santi, C....
Microelectronics Reliability. 150 (2023) - p. 115130 , 2023

Link: https://doi.org/10.1016/..

10

A novel in-situ approach to monitor the variations in the o..:

Cavaliere, A. ; De Santi, C. ; Meneghesso, G...
Microelectronics Reliability. 150 (2023) - p. 115199 , 2023

Link: https://doi.org/10.1016/..

11

Impact of Mg-doping on the performance and degradation of A..:

Piva, F. ; Grigoletto, M. ; Brescancin, R....
Applied Physics Letters. 122 (2023) 15 - p. , 2023

Link: https://doi.org/10.1063/..

12

Cryogenic-temperature investigation of negative bias stress..:

Masin, F. ; De Santi, C. ; Lettens, J....
Microelectronics Reliability. 138 (2022) - p. 114720 , 2022

Link: https://doi.org/10.1016/..

13

Study of the influence of gate etching and passivation on c..:

Chiocchetta, F. ; De Santi, C. ; Rampazzo, F....
Microelectronics Reliability. 138 (2022) - p. 114735 , 2022

Link: https://doi.org/10.1016/..

14

Compact Modeling of Nonideal Trapping/Detrapping Processes ..:

Modolo, N. ; De Santi, C. ; Baratella, G....
IEEE Transactions on Electron Devices. 69 (2022) 8 - p. 4432-4437 , 2022

Link: https://doi.org/10.1109/..

15

Study and characterization of GaN MOS capacitors: Planar vs..:

Mukherjee, K. ; De Santi, C. ; You, S....
Applied Physics Letters. 120 (2022) 14 - p. , 2022

Link: https://doi.org/10.1063/..