Gerardin, S.
183  Ergebnisse:
Personensuche X
?
1

Radiation-Induced Effects in SiC Vertical Power MOSFETs Irr..:

Bonaldo, S. ; Martinella, C. ; Race, S....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 418-426 , 2024
 
?
2

Depth Dependence of Neutron-Induced Errors in 3-D NAND Floa..:

Gerardin, S. ; Bagatin, M. ; Paccagnella, A....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 508-514 , 2024
 
?
3

Energy Deposition by Ultrahigh Energy Ions in Large and Sma..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 241-247 , 2022
 
?
4

Secondary Particles Generated by Protons in 3-D nand Flash ..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1461-1466 , 2022
 
?
6

Total Ionizing Dose effects on a 28 nm Hi-K metal-gate CMOS..:

Mattiazzo, S. ; Bagatin, M. ; Bisello, D....
Journal of Instrumentation.  12 (2017)  2 - p. C02003-C02003 , 2017
 
?
7

Thermal Modeling of the Injection of Standard and Thermally..:

Castro-Cedeno, E.-I. ; Jardy, A. ; Carré, A...
Metallurgical and Materials Transactions B.  48 (2017)  6 - p. 3316-3328 , 2017
 
?
9

Proton induced trapping effect on space compatible GaN HEMT:

Stocco, A. ; Gerardin, S. ; Bisi, D....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2213-2216 , 2014
 
?
11

Developments on DC/DC converters for the LHC experiment upg..:

Abbate, C ; Alderighi, M ; Baccaro, S...
Journal of Instrumentation.  9 (2014)  2 - p. C02017-C02017 , 2014
 
?
12

Possible effects on avionics induced by terrestrial gamma-r..:

Tavani, M. ; Argan, A. ; Paccagnella, A....
Natural Hazards and Earth System Sciences.  13 (2013)  4 - p. 1127-1133 , 2013
 
?
14

Temperature dependence of neutron-induced soft errors in SR..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
Microelectronics Reliability.  52 (2012)  1 - p. 289-293 , 2012
 
?
15

Ionizing radiation compatibility in the MITICA neutral beam..:

Bagatin, M. ; Coniglio, A. ; D'Arienzo, M....
Fusion Engineering and Design.  86 (2011)  6-8 - p. 1268-1272 , 2011
 
1-15