Kangül, Mustafa
3  Ergebnisse:
Personensuche X
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2

An atomic force microscope integrated with a helium ion mic..:

Andany, Santiago H ; Hlawacek, Gregor ; Hummel, Stefan...
Beilstein Journal of Nanotechnology.  11 (2020)  - p. 1272-1279 , 2020
 
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3

A second harmonic based resonance characterization method f..:

Aydın, Eren ; Gökçe, Furkan ; Kangül, Mustafa..
Sensors and Actuators A: Physical.  274 (2018)  - p. 220-230 , 2018
 
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