E-LIB Suche - Ergebnisse für: Kastensmidt, F. Lima

1

Evaluating Different Solutions to Design Fault Tolerant Sys..:

Sterpone, L. ; Sonza Reorda, M. ; Violante, M...
Journal of Electronic Testing. 23 (2007) 1 - p. 47-54 , 2007

Link: https://doi.org/10.1007/..

2

An automatic technique for optimizing Reed-Solomon codes to..:

Neuberger, G. ; de Lima Kastensmidt, F.G. ; Reis, R.
IEEE Design and Test of Computers. 22 (2005) 1 - p. 50-58 , 2005

Link: https://doi.org/10.1109/..

3

Designing fault-tolerant techniques for SRAM-based FPGAs:

de Lima Kastensmidt, F.G. ; Neuberger, G. ; Hentschke, R.F...
IEEE Design and Test of Computers. 21 (2004) 6 - p. 552-562 , 2004

Link: https://doi.org/10.1109/..

4

Assessing the Impacts of Radiation-induced Soft Errors on A..:

Benevenuti, F. ; Gobatto, L. ; Bastos, R. Possamai..
IEEE Transactions on Nuclear Science. , 2024

Link: https://doi.org/10.1109/..

5

Effects of thermal neutron radiation on a hardware-implemen..:

Garay Trindade, M. ; Benevenuti, F. ; Letiche, M....
Microelectronics Reliability. 116 (2021) - p. 114022 , 2021

Link: https://doi.org/10.1016/..

6

Circuit design using Schmitt Trigger to reliability improve..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability. 114 (2020) - p. 113754 , 2020

Link: https://doi.org/10.1016/..

7

Mitigation of process variability effects using decoupling ..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability. 100-101 (2019) - p. 113446 , 2019

Link: https://doi.org/10.1016/..

8

Building ATMR circuits using approximate library and heuris..:

Albandes, I. ; Martins, M. ; Cuenca-Asensi, S..
Microelectronics Reliability. 97 (2019) - p. 24-30 , 2019

Link: https://doi.org/10.1016/..

9

Approximate TMR based on successive approximation and loop ..:

Rodrigues, G.S. ; Fonseca, J.S. ; Kastensmidt, F.L....
Microelectronics Reliability. 100-101 (2019) - p. 113385 , 2019

Link: https://doi.org/10.1016/..

10

Dynamic heavy ions SEE testing of NanoXplore radiation hard..:

Oliveira, A. ; Benevenuti, F. ; Benites, L....
Microelectronics Reliability. 100-101 (2019) - p. 113437 , 2019

Link: https://doi.org/10.1016/..

11

Impact of different transistor arrangements on gate variabi..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability. 88-90 (2018) - p. 111-115 , 2018

Link: https://doi.org/10.1016/..

12

Design of approximate-TMR using approximate library and heu..:

Albandes, I. ; Serrano-Cases, A. ; Martins, M....
Microelectronics Reliability. 88-90 (2018) - p. 898-902 , 2018

Link: https://doi.org/10.1016/..

13

Evaluation of radiation-induced soft error in majority vote..:

de Aguiar, Y.Q. ; Artola, L. ; Hubert, G....
Microelectronics Reliability. 76-77 (2017) - p. 660-664 , 2017

Link: https://doi.org/10.1016/..

14

Analyzing the impact of radiation-induced failures in flash..:

Tambara, L.A. ; Chielle, E. ; Kastensmidt, F.L....
Microelectronics Reliability. 76-77 (2017) - p. 640-643 , 2017

Link: https://doi.org/10.1016/..

15

Impact of dynamic voltage scaling and thermal factors on SR..:

Rosa, F.R. ; Brum, R.M. ; Wirth, G....
Microelectronics Reliability. 55 (2015) 9-10 - p. 1486-1490 , 2015

Link: https://doi.org/10.1016/..