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Kerkhoff, Willa G
116  Ergebnisse:
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1

Increases in sensory noise predict attentional disruptions ..:

Fisher, Victoria L. ; Dean, Cassandra L. ; Nave, Claire S....
Frontiers in Human Neuroscience.  16 (2023)  - p. , 2023
Link: https://doi.org/10.3389/..
 
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2

Activation of the Rostral Intralaminar Thalamus Drives Rein..:

Cover, Kara K. ; Gyawali, Utsav ; Kerkhoff, Willa G....
Cell Reports.  26 (2019)  6 - p. 1389-1398.e3 , 2019
Link: https://doi.org/10.1016/..
 
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3

The best defense is a strong offense: preventing alcohol ab..:

Cover, Kara K. ; Kerkhoff, Willa G. ; Mathur, Brian N.
Neuropsychopharmacology.  43 (2018)  12 - p. 2331-2332 , 2018
Link: https://doi.org/10.1038/..
 
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4

Visual Distractors Disrupt Audiovisual Integration Regardle..:

Gibney, Kyla D. ; Aligbe, Enimielen ; Eggleston, Brady A....
Frontiers in Integrative Neuroscience.  11 (2017)  - p. , 2017
Link: https://doi.org/10.3389/..
 
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5

Differential expression of putative sodium-dependent cation..:

Piermarini, Peter M. ; Akuma, Daniel C. ; Crow, John C....
Comparative Biochemistry and Physiology Part A: Molecular & Integrative Physiology.  214 (2017)  - p. 40-49 , 2017
Link: https://doi.org/10.1016/..
 
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6

Expression of Sodium‐Dependent Cation‐Chloride Cotransporte..:

Jamil, Taylor L. ; Chen, Jiayu ; Crow, John C....
The FASEB Journal.  31 (2017)  S1 - p. , 2017
Link: https://doi.org/10.1096/..
 
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7

Exploiting Multiple Mahalanobis Distance Metrics to Screen ..:

Krishnan, Shaji ; Kerkhoff, Hans G.
IEEE Design & Test.  30 (2013)  3 - p. 18-24 , 2013
Link: https://doi.org/10.1109/..
 
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8

Rapid transient fault insertion in large digital systems:

Rohani, Alireza ; Kerkhoff, Hans G.
Microprocessors and Microsystems.  37 (2013)  2 - p. 147-154 , 2013
Link: https://doi.org/10.1016/..
 
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9

Fault co-simulation for test evaluation of heterogeneous in..:

Kerkhoff, Hans G. ; Zhang, Xiao
Microelectronics Journal.  40 (2009)  7 - p. 1048-1053 , 2009
Link: https://doi.org/10.1016/..
 
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10

A Dependable Microelectronic Peptide Synthesizer Using Elec..:

Kerkhoff, H. G. ; Zhang, X. ; Mailly, F....
VLSI Design.  2008 (2008)  1 - p. , 2008
Link: https://doi.org/10.1155/..
 
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11

Test structures and their application in structural testing..:

Joseph, Arun A. ; Heuvelmans, Sander ; Gerritsma, Gerrit J..
Physica C: Superconductivity.  403 (2004)  1-2 - p. 103-111 , 2004
Link: https://doi.org/10.1016/..
 
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12

Fast fault simulation for nonlinear analog circuits:

Engin, N. ; Kerkhoff, H.G.
IEEE Design & Test of Computers.  20 (2003)  2 - p. 40-47 , 2003
Link: https://doi.org/10.1109/..
 
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13

Testability-analysis driven test-generation of analogue cor..:

Stančić, M. ; Kerkhoff, H.G.
Microelectronics Journal.  34 (2003)  10 - p. 913-917 , 2003
Link: https://doi.org/10.1016/..
 
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14

Design for the testability of superconductor electronics:

Joseph, Arun A ; Kerkhoff, Hans G
Superconductor Science and Technology.  16 (2003)  12 - p. 1559-1565 , 2003
Link: https://doi.org/10.1088/..
 
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15

Application of DfT techniques to a 20GHz superconductor del..:

Joseph, Arun A ; Weusthof, Marcel H.H ; Kerkhoff, Hans G
Microelectronics Journal.  33 (2002)  10 - p. 791-798 , 2002
Link: https://doi.org/10.1016/..
 
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