Loo, R.
1223  Ergebnisse:
Personensuche X
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1

If an entertainment company organized your graduate medical..:

Wild, D. ; Bischoff, M. ; Dehnen, D....
Zeitschrift für Allgemeinmedizin.  99 (2023)  5 - p. 240-244 , 2023
 
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2

Multi-Domain Interventions for Dementia Prevention–A System..:

Castro, C.B. ; Costa, L.M. ; Dias, C.B....
The Journal of nutrition, health and aging.  27 (2023)  12 - p. 1271-1280 , 2023
 
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3

Epitaxial Ge-on-Nothing and Epitaxial Ge on Si-on-Nothing a..:

Loo, R. ; Porret, C. ; Han, H....
ECS Journal of Solid State Science and Technology.  10 (2021)  8 - p. 084003 , 2021
 
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4

Epitaxial Growth of Active Si on Top of SiGe Etch Stop Laye..:

Loo, R. ; Jourdain, A. ; Rengo, G....
ECS Journal of Solid State Science and Technology.  10 (2021)  1 - p. 014001 , 2021
 
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5

Very Low Temperature Epitaxy of Group-IV Semiconductors for..:

Porret, C. ; Hikavyy, A. ; Granados, J. F. Gomez...
ECS Journal of Solid State Science and Technology.  8 (2019)  8 - p. P392-P399 , 2019
 
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6

TEM investigations of gate-all-around nanowire devices:

Favia, P ; Richard, O ; Eneman, G...
Semiconductor Science and Technology.  34 (2019)  12 - p. 124003 , 2019
 
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8

Editors' Choice—Epitaxial CVD Growth of Ultra-Thin Si Passi..:

Loo, R. ; Arimura, H. ; Cott, D....
ECS Journal of Solid State Science and Technology.  7 (2018)  2 - p. P66-P72 , 2018
 
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9

A FRAMEWORK FOR RELIABLE THREE-DIMENSIONAL UNDERGROUND UTIL..:

van Son, R. ; Jaw, S. W. ; Yan, J....
The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences.  XLII-4/W10 (2018)  - p. 209-214 , 2018
 
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10

Scalability comparison between raised- and embedded-SiGe so..:

Yamaguchi, S. ; Witters, L. ; Mitard, J....
Microelectronics Reliability.  83 (2018)  - p. 157-161 , 2018
 
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13

Use of high order precursors for manufacturing gate all aro..:

Hikavyy, A. ; Zyulkov, I. ; Mertens, H....
Materials Science in Semiconductor Processing.  70 (2017)  - p. 24-29 , 2017
 
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14

Carbon-Related Defects in Si:C/Silicon Heterostructures Ass..:

Simoen, E. ; Dhayalan, S. K. ; Hikavyy, A....
ECS Journal of Solid State Science and Technology.  6 (2017)  5 - p. P284-P289 , 2017
 
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