Moens, P.
322  Ergebnisse:
Personensuche X
?
1

Origin and Recovery of Negative VTH Shift on 4H–SiC MOS Cap..:

Marcuzzi, A. ; Avramenko, M. ; De Santi, C....
Materials Science in Semiconductor Processing.  177 (2024)  - p. 108389 , 2024
 
?
2

Cryogenic-temperature investigation of negative bias stress..:

Masin, F. ; De Santi, C. ; Lettens, J....
Microelectronics Reliability.  138 (2022)  - p. 114720 , 2022
 
?
 
?
4

OFF-state trapping phenomena in GaN HEMTs: Interplay betwee..:

Canato, E. ; Meneghini, M. ; De Santi, C....
Microelectronics Reliability.  114 (2020)  - p. 113841 , 2020
 
?
6

ESD-failure of E-mode GaN HEMTs: Role of device geometry an..:

Canato, E. ; Meneghini, M. ; Nardo, A....
Microelectronics Reliability.  100-101 (2019)  - p. 113334 , 2019
 
?
7

Impact of sidewall etching on the dynamic performance of Ga..:

Tajalli, A. ; Canato, E. ; Nardo, A....
Microelectronics Reliability.  88-90 (2018)  - p. 572-576 , 2018
 
?
 
?
 
?
10

Low PIP2 molar fractions induce nanometer size clustering i..:

Salvemini, Iyrri L. ; Gau, D.M. ; Reid, J....
Chemistry and Physics of Lipids.  177 (2014)  - p. 51-63 , 2014
 
?
11

Green fluorescent protein expression triggers proteome chan..:

Coumans, J.V.F. ; Gau, D. ; Poljak, A....
Experimental Cell Research.  320 (2014)  1 - p. 33-45 , 2014
 
?
12

Influence of charge balance on the robustness of trench-bas..:

Villamor-Baliarda, A. ; Vanmeerbeek, P. ; Riccio, M....
Microelectronics Reliability.  52 (2012)  9-10 - p. 2409-2413 , 2012
 
?
13

Wafer scale and reliability investigation of thin HfO2·AlGa..:

Fontserè, A. ; Pérez-Tomás, A. ; Godignon, P....
Microelectronics Reliability.  52 (2012)  9-10 - p. 2220-2223 , 2012
 
?
 
1-15