Mollov, S.
156  Ergebnisse:
Personensuche X
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2

Analysis of the aging mechanism occurring at the bond-wire ..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  114 (2020)  - p. 113873 , 2020
 
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3

Using of bond-wire resistance as aging indicator of semicon..:

Ibrahim, A. ; Khatir, Z. ; Ousten, J.P....
Microelectronics Reliability.  114 (2020)  - p. 113757 , 2020
 
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4

Analysis of the degradation mechanisms occurring in the top..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  88-90 (2018)  - p. 462-469 , 2018
 
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7

Fuzzy model-based predictive control using Takagi–Sugeno mo..:

Roubos, J.A. ; Mollov, S. ; Babuška, R..
International Journal of Approximate Reasoning.  22 (1999)  1-2 - p. 3-30 , 1999
 
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13

Molecular phylogeny, diagnostics, and diversity of plant-pa..:

Subbotin, Sergei A. ; Chitambar, John J. ; Chizhov, Vlamidir N....
Zoological Journal of the Linnean Society.  171 (2014)  3 - p. 475-506 , 2014
 
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