E-LIB Suche - Ergebnisse für: Nishizawa, Shinichi

1

De-Correlation and De-Bias Post-Processing Circuits for Tru..:

Zhang, Ruilin ; Zhang, Haochen ; Wang, Xingyu...
IEEE Transactions on Circuits and Systems I: Regular Papers. , 2024

Link: https://doi.org/10.1109/..

2

Study on stress in trench structures during silicon IGBTs p..:

Cai, Bozhou ; Yuan, Jiuyang ; Miyamura, Yoshiji..
Japanese Journal of Applied Physics. 63 (2024) 3 - p. 03SP16 , 2024

Link: https://doi.org/10.35848..

3

Impact of p-Gate Contact in GaN-HEMTs on Overvoltage Stress..:

Saito, Wataru ; NIshizawa, Shin-Ichi
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3590-3595 , 2024

Link: https://doi.org/10.1109/..

4

A Model of Wafer Warpage for Trench Field‐Plate Power MOSFE..:

Kato, Hiroaki ; Cai, Bozhou ; Yuan, Jiuyang...
physica status solidi (a). , 2024

Link: https://doi.org/10.1002/..

5

Mechanism of gate voltage spike under digital gate control ..:

Lou, Zaiqi ; Mamee, Thatree ; Hata, Katsuhiro...
Power Electronic Devices and Components. 7 (2024) - p. 100054 , 2024

Link: https://doi.org/10.1016/..

6

Estimating of IGBT Bond Wire Lift-Off Trend Using Convoluti..:

Mamee, Thatree ; Lou, Zaiqi ; Hata, Katsuhiro...
IEEE Access. 12 (2024) - p. 96936-96945 , 2024

Link: https://doi.org/10.1109/..

7

Turn-off switching voltage surge analysis with dependence o..:

Fujimoto, Yuri ; Nishizawa, Shin-ichi ; Saito, Wataru
Japanese Journal of Applied Physics. 63 (2024) 2 - p. 02SP36 , 2024

Link: https://doi.org/10.35848..

8

Numerical and experimental investigation of the effect of t..:

Suewaka, Ryota ; Saishoji, Toshiaki ; Nishizawa, Shin-ichi
Japanese Journal of Applied Physics. 63 (2024) 3 - p. 031006 , 2024

Link: https://doi.org/10.35848..

9

Overvoltage Failure Process of Cascode GaN Field Effect Tra..:

Saito, Wataru ; Nishizawa, Shin‐ichi
physica status solidi (a). , 2024

Link: https://doi.org/10.1002/..

10

Paralleled SiC MOSFETs Circuit Breaker With a SiC MPS Diode..:

Takamori, Taro ; Wada, Keiji ; Saito, Wataru.
IEEE Open Journal of Power Electronics. 5 (2024) - p. 392-401 , 2024

Link: https://doi.org/10.1109/..

11

Evaluation of thermally activated defects behaviors in nitr..:

Kajiwara, Kaoru ; Eriguchi, Kazutaka ; Fusegawa, Kazuhiro...
Japanese Journal of Applied Physics. 62 (2023) 7 - p. 075504 , 2023

Link: https://doi.org/10.35848..

12

Libretto: An Open Cell Timing Characterizer for Open Source..:

NISHIZAWA, Shinichi ; NAKURA, Toru
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. E106.A (2023) 3 - p. 551-559 , 2023

Link: https://doi.org/10.1587/..

13

Effect of crucible thermal conductivity on dislocation dist..:

Miyazaki, Kazuma ; Nakano, Satoshi ; Nishizawa, Shin-ichi.
Journal of Crystal Growth. 603 (2023) - p. 126981 , 2023

Link: https://doi.org/10.1016/..

14

Reliability investigation of repeated unclamped inductive s..:

Takamori, Taro ; Wada, Keiji ; Saito, Wataru.
Microelectronics Reliability. 150 (2023) - p. 115119 , 2023

Link: https://doi.org/10.1016/..

15

Numerical and experimental investigation of effect of oxyge..:

Suewaka, Ryota ; Saishoji, Toshiaki ; Nishizawa, Shin-ichi
Japanese Journal of Applied Physics. 62 (2023) 7 - p. 071002 , 2023

Link: https://doi.org/10.35848..