E-LIB Suche - Ergebnisse für: Rideau, D.

1

Prediction of the evolution of defects induced by the heate..:

Julliard, P.L. ; Johnsson, A. ; Zographos, N....
Solid-State Electronics. 200 (2023) - p. 108521 , 2023

Link: https://doi.org/10.1016/..

2

Avalanche breakdown and quenching in Ge SPAD using 3D Monte..:

Dollfus, P. ; Saint-Martin, J. ; Cazimajou, T....
Solid-State Electronics. 194 (2022) - p. 108361 , 2022

Link: https://doi.org/10.1016/..

3

Modeled optical properties of SiGe and Si layers compared t..:

Kriso, C. ; Triozon, F. ; Delerue, C....
Solid-State Electronics. 129 (2017) - p. 93-96 , 2017

Link: https://doi.org/10.1016/..

4

Reliable gate stack and substrate parameter extraction base..:

Mohamad, B. ; Leroux, C. ; Rideau, D....
Solid-State Electronics. 128 (2017) - p. 10-16 , 2017

Link: https://doi.org/10.1016/..

5

4 The novel p.Cys1410* mutation causes severe neonatal CF i..:

Mekki, C. ; Mirlesse, V. ; Le Floch, A....
Journal of Cystic Fibrosis. 16 (2017) - p. S63-S64 , 2017

Link: https://doi.org/10.1016/..

6

How to assess hemodynamic status in very preterm newborns i..:

Escourrou, G ; Renesme, L ; Zana, E...
Journal of Perinatology. 37 (2017) 9 - p. 987-993 , 2017

Link: https://doi.org/10.1038/..

7

Remote surface roughness scattering in fully depleted silic..:

Niquet, Y. M. ; Duchemin, I. ; Nguyen, V.-H...
Applied Physics Letters. 106 (2015) 2 - p. , 2015

Link: https://doi.org/10.1063/..

8

Multi-scale strategy for high-k/metal-gate UTBB-FDSOI devic..:

Nier, O. ; Rideau, D. ; Niquet, Y. M....
Journal of Computational Electronics. 12 (2013) 4 - p. 675-684 , 2013

Link: https://doi.org/10.1007/..

9

Understanding Ge impact on VT and VFB in Si1−xGex/Si pMOSFE..:

Soussou, A. ; Leroux, C. ; Rideau, D....
Microelectronic Engineering. 109 (2013) - p. 282-285 , 2013

Link: https://doi.org/10.1016/..

10

Unexpected impact of germanium content in SiGe bulk PMOSFET:

Diouf, C. ; Cros, A. ; Soussou, A....
Solid-State Electronics. 86 (2013) - p. 45-50 , 2013

Link: https://doi.org/10.1016/..

11

Microscopic scale characterization and modeling of transist..:

Mamy Randriamihaja, Yoann ; Huard, V. ; Federspiel, X....
Microelectronics Reliability. 52 (2012) 11 - p. 2513-2520 , 2012

Link: https://doi.org/10.1016/..

12

Characterization and 3D TCAD simulation of NOR-type flash n..:

Zaka, A. ; Singer, J. ; Dornel, E....
Solid-State Electronics. 63 (2011) 1 - p. 158-162 , 2011

Link: https://doi.org/10.1016/..

13

Prise en charge des crises du nouveau-né:

Roubertie, A. ; Masson, F. ; de Villepin-Touzery, A....
Archives de Pédiatrie. 18 (2011) - p. S56-S64 , 2011

Link: https://doi.org/10.1016/..

14

SiGe:C HBT transit time analysis based on hydrodynamic mode..:

Ramirez-Garcia, E. ; Michaillat, M. ; Aniel, F....
Solid-State Electronics. 61 (2011) 1 - p. 58-64 , 2011

Link: https://doi.org/10.1016/..

15

Full-Band Monte Carlo investigation of hole mobilities in S..:

Michaillat, M. ; Rideau, D. ; Aniel, F...
Thin Solid Films. 518 (2010) 9 - p. 2437-2441 , 2010

Link: https://doi.org/10.1016/..