E-LIB Suche - Ergebnisse für: Sterpone, L.

1

Evaluating reliability against SEE of embedded systems: A c..:

De Sio, C. ; Azimi, S. ; Sterpone, L.
Microelectronics Reliability. 150 (2023) - p. 115124 , 2023

Link: https://doi.org/10.1016/..

2

A comparative radiation analysis of reconfigurable memory t..:

Azimi, S. ; De Sio, C. ; Portaluri, A...
Microelectronics Reliability. 138 (2022) - p. 114733 , 2022

Link: https://doi.org/10.1016/..

3

Failure rate analysis of radiation tolerant design techniqu..:

Vacca, E. ; Azimi, S. ; Sterpone, L.
Microelectronics Reliability. 138 (2022) - p. 114778 , 2022

Link: https://doi.org/10.1016/..

4

Analysis of radiation-induced transient errors on 7 nm FinF..:

Azimi, S. ; De Sio, C. ; Sterpone, L.
Microelectronics Reliability. 126 (2021) - p. 114319 , 2021

Link: https://doi.org/10.1016/..

5

On the analysis of radiation-induced failures in the AXI in..:

De Sio, C. ; Azimi, S. ; Sterpone, L.
Microelectronics Reliability. 114 (2020) - p. 113733 , 2020

Link: https://doi.org/10.1016/..

6

Improving GPU register file reliability with a comprehensiv..:

Gonçalves, M.M. ; Condia, J.E. Rodriguez ; Reorda, M. Sonza..
Microelectronics Reliability. 114 (2020) - p. 113768 , 2020

Link: https://doi.org/10.1016/..

7

A new CAD tool for Single Event Transient Analysis and miti..:

Azimi, S. ; Du, B. ; Sterpone, L....
Integration. 67 (2019) - p. 73-81 , 2019

Link: https://doi.org/10.1016/..

8

Radiation-induced Single Event Transient effects during the..:

De Sio, C. ; Azimi, S. ; Bozzoli, L...
Microelectronics Reliability. 100-101 (2019) - p. 113342 , 2019

Link: https://doi.org/10.1016/..

9

Yellow mealworm larvae (Tenebrio molitor) inclusion in diet..:

Biasato, I. ; Gasco, L. ; De Marco, M....
Poultry Science. 97 (2018) 2 - p. 540-548 , 2018

Link: https://doi.org/10.3382/..

10

On the analysis of radiation-induced Single Event Transient..:

Azimi, S. ; Sterpone, L. ; Du, B..
Microelectronics Reliability. 88-90 (2018) - p. 936-940 , 2018

Link: https://doi.org/10.1016/..

11

An FPGA-based dynamically reconfigurable platform for emula..:

Ullah, A. ; Sanchez, E. ; Sterpone, L...
Microelectronics Reliability. 75 (2017) - p. 110-120 , 2017

Link: https://doi.org/10.1016/..

12

On the prediction of radiation-induced SETs in flash-based ..:

Azimi, S. ; Du, B. ; Sterpone, L.
Microelectronics Reliability. 64 (2016) - p. 230-234 , 2016

Link: https://doi.org/10.1016/..

13

Layout and Radiation Tolerance Issues in High-Speed Links:

Giordano, R. ; Aloisio, A. ; Bocci, V....
IEEE Transactions on Nuclear Science. 62 (2015) 6 - p. 3177-3185 , 2015

Link: https://doi.org/10.1109/..

14

Radiation-induced single event transients modeling and test..:

Sterpone, L. ; Du, B. ; Azimi, S.
Microelectronics Reliability. 55 (2015) 9-10 - p. 2087-2091 , 2015

Link: https://doi.org/10.1016/..

15

Evaluating the radiation sensitivity of GPGPU caches: New a..:

Sabena, D. ; Sonza Reorda, M. ; Sterpone, L...
Microelectronics Reliability. 54 (2014) 11 - p. 2621-2628 , 2014

Link: https://doi.org/10.1016/..