E-LIB Suche - Ergebnisse für: Tyaginov, Stanislav

1

Evidence of contact-induced variability in industrially-fab..:

Panarella, Luca ; Kaczer, Ben ; Smets, Quentin...
npj 2D Materials and Applications. 8 (2024) 1 - p. , 2024

Link: https://doi.org/10.1038/..

2

Compact Physics Hot-Carrier Degradation Model Valid over a ..:

Tyaginov, Stanislav ; Bury, Erik ; Grill, Alexander...
Micromachines. 14 (2023) 11 - p. 2018 , 2023

Link: https://doi.org/10.3390/..

3

Impact of Nitridation on Bias Temperature Instability and H..:

Tyaginov, Stanislav ; O'Sullivan, Barry ; Chasin, Adrian...
Micromachines. 14 (2023) 8 - p. 1514 , 2023

Link: https://doi.org/10.3390/..

4

Structure, electronic properties, and energetics of oxygen ..:

El-Sayed, Al-Moatasem ; Jech, Markus ; Waldhör, Dominic...
Physical Review Materials. 6 (2022) 12 - p. , 2022

Link: https://doi.org/10.1103/..

5

TCAD Modeling of Temperature Activation of the Hysteresis C..:

Vasilev, Alexander ; Jech, Markus ; Grill, Alexander...
IEEE Transactions on Electron Devices. 69 (2022) 6 - p. 3290-3295 , 2022

Link: https://doi.org/10.1109/..

6

Quantum Chemistry Treatment of Silicon-Hydrogen Bond Ruptur..:

Jech, Markus ; El-Sayed, Al-Moatasem ; Tyaginov, Stanislav...
Physical Review Applied. 16 (2021) 1 - p. , 2021

Link: https://doi.org/10.1103/..

7

Mixed Hot-Carrier/Bias Temperature Instability Degradation ..:

Jech, Markus ; Rott, Gunnar ; Reisinger, Hans...
IEEE Transactions on Electron Devices. 67 (2020) 8 - p. 3315-3322 , 2020

Link: https://doi.org/10.1109/..

8

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Par..:

Makarov, Alexander ; Roussel, Philippe ; Bury, Erik...
Micromachines. 11 (2020) 7 - p. 657 , 2020

Link: https://doi.org/10.3390/..

9

The role of cold carriers and the multiple-carrier process ..:

Sharma, Prateek ; Tyaginov, Stanislav ; Jech, Markus...
Solid-State Electronics. 115 (2016) - p. 185-191 , 2016

Link: https://doi.org/10.1016/..

10

On the limits of applicability of drift-diffusion based hot..:

Jech, Markus ; Sharma, Prateek ; Tyaginov, Stanislav..
Japanese Journal of Applied Physics. 55 (2016) 4S - p. 04ED14 , 2016

Link: https://doi.org/10.7567/..

11

On the importance of electron–electron scattering for hot-c..:

Tyaginov, Stanislav ; Bina, Markus ; Franco, Jacopo...
Japanese Journal of Applied Physics. 54 (2015) 4S - p. 04DC18 , 2015

Link: https://doi.org/10.7567/..

12

Modeling of hot-carrier degradation based on thorough carri..:

Tyaginov, Stanislav ; Wimmer, Yannick ; Grasser, Tibor
Facta universitatis - series: Electronics and Energetics. 27 (2014) 4 - p. 479-508 , 2014

Link: https://doi.org/10.2298/..

13

Impact of O–Si–O bond angle fluctuations on the Si–O bond-b..:

Tyaginov, Stanislav ; Sverdlov, Viktor ; Starkov, Ivan..
Microelectronics Reliability. 49 (2009) 9-11 - p. 998-1002 , 2009

Link: https://doi.org/10.1016/..

14

An analytical approach for the determination of the lateral..:

Illarionov, Yury Yu. ; Bina, Markus ; Tyaginov, Stanislav E..
Japanese Journal of Applied Physics. 53 (2014) 4S - p. 04EC22 , 2014

Link: https://doi.org/10.7567/..

15

Physics-Based Hot-Carrier Degradation Modeling:

Tyaginov, Stanislav E. ; Starkov, Ivan ; Enichlmair, Hubert...
ECS Transactions. 35 (2011) 4 - p. 321-352 , 2011

Link: https://doi.org/10.1149/..