Wenpo, Zhang
149  Ergebnisse:
Personensuche X
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3

Scan Shift Time Reduction Using Test Compaction for On-Chip..:

ZHANG, Wenpo ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E97.D (2014)  3 - p. 533-540 , 2014
 
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4

Improving Small-Delay Fault Coverage of On-Chip Delay Measu..:

ZHANG, Wenpo ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E97.D (2014)  10 - p. 2719-2729 , 2014
 
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5

Improving Test Coverage by Measuring Path Delay Time Includ..:

ZHANG, Wenpo ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E96.D (2013)  5 - p. 1219-1222 , 2013
 
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10

Identification of Direct Anchoring Sites for Monoatomic Dis..:

Wang, Fei ; Li, Kai ; Li, Bolang...
Angewandte Chemie International Edition.  63 (2024)  11 - p. , 2024
 
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13

Electron transferring with oxygen defects on Ni-promoted Pd..:

Cai, Jieying ; Wang, Jingyi ; Liu, Congwei...
Journal of Colloid and Interface Science.  671 (2024)  - p. 712-724 , 2024
 
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