Chee, D.
3  Ergebnisse:
Personensuche X
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1

Learning from worked-out problems in manufacturing technolo.. 

a comparison between instructional explanation and self-exp... 
Lai, Chee Sern - 1. ed . , 2011
Exemplare: Zentrale; BB WiWi;
 
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2

Computational intelligence-based testing for robust circuit.. 

Selected topics of electronics and micromechatronics ; 22
Exemplar:  Zentrale:Magazin 01.R.8075
 
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